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International Journal of Materials Research

Volumn 99, Issue 5, 2008, Pages 454-460

Laser-assisted atom probe tomography and nanosciences

(8) Blavette, Didier a,b Kassab, Talaat Al c Cadel, Emanuel a Mackel, Alexander c Vurpillot, François a Gilbert, Mathieu a Cojocaru, Oana a Deconihout, Bernard a

a UNIVERSITÉ DE ROUEN (France)

b INSTITUT UNIVERSITAIRE DE FRANCE (France)

c Institut fur Materialphysik (Germany)

Author keywords

Laser assisted 3D atom probe; Nano analysis; Nanocontacts; Silicides; Tunnel junctions

Indexed keywords

LASER APPLICATIONS; NANOTECHNOLOGY; SILICIDES; TUNNEL JUNCTIONS;

LASER ASSISTED 3D ATOM PROBE; NANOCONTACTS;

TOMOGRAPHY;

EID: 44449129910 PISSN: 18625282 EISSN: None Source Type: Journal
DOI: 10.3139/146.101672 Document Type: Article

Times cited : (25)

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