Thin film colossal dielectric constant oxide La2-xSr xNiO4: Synthesis, dielectric relaxation measurements, and electrode effects

Journal of Applied Physics

Volumn 109, Issue 1, 2011, Pages

  Podpirka, Adrian Podpirka ^a   Ramanathan, Shriram Ramanathan ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AC CONDUCTIVITY; APPLIED BIAS; BULK SINGLE CRYSTALS; COLOSSAL DIELECTRIC CONSTANT; DIELECTRIC CONSTANTS; DIELECTRIC RELAXATION MEASUREMENTS; DIELECTRIC RESPONSE; ELECTRODE EFFECTS; ELECTRODE MATERIAL; ENERGY DISPERSIVE SPECTRUM; IMPEDANCE SPECTROSCOPY; METALLIC TARGETS; PHASE PURITY; REACTIVE CO-SPUTTERING; VARYING TEMPERATURE;

ACTIVATION ENERGY; ELECTROCHEMICAL ELECTRODES; GRAIN BOUNDARIES; LANTHANUM; PALLADIUM; PERMITTIVITY; PLATINUM; THIN FILMS; X RAY DIFFRACTION;

SINGLE CRYSTALS;

EID: 78751491815     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3528161     Document Type: Article

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