Investigation of triple extrinsic origins of colossal dielectric constant in CaCu3 Ti4 O12 ceramics

Journal of the Electrochemical Society

Volumn 157, Issue 5, 2010, Pages

  Yuan, Wen Xiang ^a   Hark, Sui Kong ^a   Mei, Wai Ning ^b  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b UNIVERSITY OF NEBRASKA AT OMAHA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AC CONDUCTIVITY; COLOSSAL DIELECTRIC CONSTANT; DIELECTRIC PERMITTIVITIES; DIELECTRIC RESPONSE; FREQUENCY REGIONS; GRAIN BOUNDARY RESISTIVITY; IMPEDANCE SPECTROSCOPY; INSULATING BARRIER LAYERS; LOW FREQUENCY; MAXWELL-WAGNER RELAXATION; POLYCRYSTALLINE; ROOM TEMPERATURE; SURFACE RESISTIVITY; WET-CHEMISTRY;

CALCIUM ALLOYS; GRAIN BOUNDARIES; PERMITTIVITY;

CERAMIC MATERIALS;

EID: 77951151144     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3353040     Document Type: Article

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