Giant dielectric response in (Li, Ti)-doped NiO ceramics synthesized by the polymerized complex method

Acta Materialia

Volumn 55, Issue 8, 2007, Pages 2851-2861

  Maensiri, Santi ^a   Thongbai, Prasit ^a   Yamwong, Teerapon ^b  

^a Small and Strong Materials Group (SSMG)   (Thailand)

^b NATIONAL METAL AND MATERIALS TECHNOLOGY CENTER   (Thailand)

Author keywords

Dielectrics; Electron diffraction; Powder processing; Scanning electron microscopy; X ray diffraction

Indexed keywords

LITHIUM COMPOUNDS; NICKEL OXIDE; SCANNING ELECTRON MICROSCOPY; SYNTHESIS (CHEMICAL); THERMOGRAVIMETRIC ANALYSIS; TITANIUM COMPOUNDS; X RAY DIFFRACTION;

MAXWELL-WAGNER POLARIZATION; POLYMERIZED COMPLEX (PC) METHOD; POWDER PROCESSING; WEAK TEMPERATURE;

CERAMIC PRODUCTS;

EID: 34047269582     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.12.024     Document Type: Article

References (40)

1. Lunkenheimer P., Loidl A., Ottermann C.R., and Bange K. Phys Rev B 44 (1991) 5927
2. Morin F.J. Phys Rev 93 (1954) 1199
3. van Houten S. J Phys Chem Solid 17 (1960) 7
4. Koide S. J Phys Soc Jpn 20 (1965) 123
5. Bosman A.J., and Crevecoeur C. Phys Rev 144 (1966) 763
6. Wu J., Nan C.W., Lin Y., and Deng Y. Phys Rev Lett 89 (2002) 217601
7. Wu J.B., Nan J., Nan C.W., Lin L., Deng Y., and Zhao S. Mater Sci Eng B 99 (2003) 294
8. Dang Z.M., and Nan C.W. Ceram Int 31 (2005) 349
9. Lin Y., Zhao R., Wang J., Cai J., Nan C.W., Wang Y., et al. J Am Ceram Soc 88 (2005) 1808
10. Lin Y., Li M., Nan C.W., and Li J. Appl Phys Lett 89 (2006) 032907
11. Lin Y., Wang J., Jiang L., Chen Y., and Nan C.W. Appl Phys Lett 85 (2004) 5664
12. Lin Y., Jiang L., Zhao R., and Nan C.W. Phys Rev B 72 (2005) 014103
13. 3 boundary layer capacitor. In: Levinson L.M. (Ed). Advanced ceramics vol. 1 (1981), The American Ceramic Society, Columbus (OH) 272
14. Yang C.F. Jpn J Appl Phys 35 (1996) 1806
15. Yang C.F. Jpn J Appl Phys 36 (1997) 188
16. Clark D.R. J Appl Phys 49 (1978) 2407
17. Olsson E., Falk L.K.L., and Dunlop G.L. J Mater Sci 20 (1985) 4091
18. Olsson E., and Dunlop G.L. J Appl Phys 66 (1989) 3666
19. Wang H.F., and Chiang Y.M. J Am Ceram Soc 81 (1999) 89
20. Shen H., Song Y.W., Gu H., Wang P.C., and Xi Y.M. Mater Lett 56 (2002) 802
21. Fang P.A., Gu H., Shen H., Song Y.W., Wang P.C., and Ceh M. J Eur Ceram Soc 24 (2004) 2509
22. Sinclair D.C., Adams T.A., Morrison F.D., and West A.R. Appl Phys Lett 80 (2002) 2153
23. Adams T.A., Sinclair D.C., and West A.R. Adv Mater (Weinheim, Ger) 18 (2002) 1321
24. West A.R., Adams T.A., Morrison F.D., and Sinclair D.C. J Eur Ceram Soc 24 (2004) 1439
25. Zhang L., and Tang Z.J. Phys Rev B 70 (2004) 174306
26. Chiodelli G., Massarotti V., Capsoni D., Bini M., Azzoni C.B., Mozzati M.C., et al. Solid State Commun 132 (2004) 241
27. Capsoni D., Bini M., Massarotti V., Chiodelli G., Mozzatic M.C., and Azzoni C.B. J Solid State Chem 177 (2004) 4494
28. Waku S. Rev Electron Commun Lab 15 (1967) 689
29. Bonsack J.P. Am Ceram Bull 50 (1971) 488
30. Goodman G. Capacitors based on ceramic grain boundary barrier - a review. In: Levinson L.M. (Ed). Advanced ceramics vol. 1 (1981), The American Ceramic Society, Columbus (OH) 215
31. Goodman G. Ceramic capacitor materials. In: Buchanan R.C. (Ed). Ceramic materials for electronics - processing, properties, and applications (1991), Marcel Dekker, New York (NY) 69
32. Fujimoto M., and Kingery D. J Am Ceram Soc 68 (1985) 169
33. Pechini MP. US Patent No. 3330697; 1967.
34. Kakihana M. J Sol-Gel Sci Technol 6 (1995) 4
35. Maensiri S., Sreesongmuang J., Thomas C., and Klinkaewnarong J. J Magn Magn Mater 301 (2006) 422
36. Cullity B.D., and Stock S.R. Elements of X-ray diffraction. 3rd ed. (2001), Prentice Hall, Englewood Cliffs (NJ)
37. Losad N.N., Ruis G.J., Morks E.V., and Morpurgo A.F. J Appl Phys 95 (2004) 8087
38. Tang Q., Shen M., and Fang L. Solid State Commun 135 (2005) 707
39. Yu Z., and Ang C. J Appl Phys 91 (2002) 794
40. Cole K.S., and Cole R.H. J Chem Phys 9 (1941) 341