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Volumn 59, Issue 4, 2011, Pages 1474-1481

Evolution of the microstructure of Sn-Ag-Cu solder joints exposed to ultrasonic waves during solidification

Author keywords

Cavitation; Intermetallic compounds; Soldering; Solidification microstructure; Ultrasonic waves

Indexed keywords

EVOLUTION OF THE MICROSTRUCTURE; INTERMETALLIC COMPOUNDS; INTERMETALLIC LAYER; MATRIX; REFLOW PROCESS; REFLOW--SOLDERING; SN DENDRITES; SNAGCU SOLDER; SOLDER JOINTS; SOLIDIFICATION MICROSTRUCTURE; SOLIDIFICATION PROCESS; TERNARY EUTECTICS;

EID: 78651383678     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.11.011     Document Type: Article
Times cited : (119)

References (27)
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    • P. Tu, Y. Chan, and J. Lai Advanced packaging IEEE Trans 24 2001 197 205
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    • Tu, P.1    Chan, Y.2    Lai, J.3
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    • H. Ma J Mater Sci 44 2009 3841 3851
    • (2009) J Mater Sci , vol.44 , pp. 3841-3851
    • Ma, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.