-
1
-
-
0043093732
-
-
0741-3106,. 10.1109/LED.2003.813381
-
S. Kim, B. Cho, M. Li, X. Yu, C. Zhu, A. Chin, and D. Kwong, IEEE Electron Device Lett. 0741-3106 24, 387 (2003). 10.1109/LED.2003.813381
-
(2003)
IEEE Electron Device Lett.
, vol.24
, pp. 387
-
-
Kim, S.1
Cho, B.2
Li, M.3
Yu, X.4
Zhu, C.5
Chin, A.6
Kwong, D.7
-
2
-
-
0037959796
-
-
0003-6951,. 10.1063/1.1569985
-
S. Lee, H. Kim, P. McIntyre, K. Saraswat, and J. Byun, Appl. Phys. Lett. 0003-6951 82, 2874 (2003). 10.1063/1.1569985
-
(2003)
Appl. Phys. Lett.
, vol.82
, pp. 2874
-
-
Lee, S.1
Kim, H.2
McIntyre, P.3
Saraswat, K.4
Byun, J.5
-
3
-
-
0036540809
-
-
0741-3106,. 10.1109/55.992833
-
S. B. Chen, C. H. Lai, A. Chin, J. C. Hsieh, and J. Liu, IEEE Electron Device Lett. 0741-3106 23, 185 (2002). 10.1109/55.992833
-
(2002)
IEEE Electron Device Lett.
, vol.23
, pp. 185
-
-
Chen, S.B.1
Lai, C.H.2
Chin, A.3
Hsieh, J.C.4
Liu, J.5
-
4
-
-
0042745683
-
-
0741-3106,. 10.1109/LED.2003.812572
-
M. Yang, C. Huang, A. Chin, C. Zhu, M. Li, and D. Kwong, IEEE Electron Device Lett. 0741-3106 24, 306 (2003). 10.1109/LED.2003.812572
-
(2003)
IEEE Electron Device Lett.
, vol.24
, pp. 306
-
-
Yang, M.1
Huang, C.2
Chin, A.3
Zhu, C.4
Li, M.5
Kwong, D.6
-
5
-
-
3242693602
-
-
0013-4651,. 10.1149/1.1752935
-
M. Y. Yang, D. S. Yu, and A. Chin, J. Electrochem. Soc. 0013-4651 151, F162 (2004). 10.1149/1.1752935
-
(2004)
J. Electrochem. Soc.
, vol.151
, pp. 162
-
-
Yang, M.Y.1
Yu, D.S.2
Chin, A.3
-
6
-
-
34848836983
-
-
0003-6951,. 10.1063/1.2790478
-
J. Manceau, S. Bruyere, S. Jeannot, A. Sylvestre, and P. Gonon, Appl. Phys. Lett. 0003-6951 91, 132907 (2007). 10.1063/1.2790478
-
(2007)
Appl. Phys. Lett.
, vol.91
, pp. 132907
-
-
Manceau, J.1
Bruyere, S.2
Jeannot, S.3
Sylvestre, A.4
Gonon, P.5
-
7
-
-
0037084710
-
-
0556-2805,. 10.1103/PhysRevB.65.075105
-
X. Zhao and D. Vanderbilt, Phys. Rev. B 0556-2805 65, 075105 (2002). 10.1103/PhysRevB.65.075105
-
(2002)
Phys. Rev. B
, vol.65
, pp. 075105
-
-
Zhao, X.1
Vanderbilt, D.2
-
8
-
-
38049010868
-
-
0003-6951,. 10.1063/1.2828696
-
D. Fischer and A. Kersch, Appl. Phys. Lett. 0003-6951 92, 012908 (2008). 10.1063/1.2828696
-
(2008)
Appl. Phys. Lett.
, vol.92
, pp. 012908
-
-
Fischer, D.1
Kersch, A.2
-
9
-
-
68249143053
-
-
0021-8979,. 10.1063/1.3182636
-
D. Tsoutsou, G. Apostolopoulos, S. Galata, P. Tsipas, A. Sotiropoulos, G. Mavrou, Y. Panayiotatos, A. Dimoulas, A. Lagoyannis, and A. Karydas, J. Appl. Phys. 0021-8979 106, 024107 (2009). 10.1063/1.3182636
-
(2009)
J. Appl. Phys.
, vol.106
, pp. 024107
-
-
Tsoutsou, D.1
Apostolopoulos, G.2
Galata, S.3
Tsipas, P.4
Sotiropoulos, A.5
Mavrou, G.6
Panayiotatos, Y.7
Dimoulas, A.8
Lagoyannis, A.9
Karydas, A.10
-
10
-
-
48249125066
-
-
0003-6951,. 10.1063/1.2958238
-
Y. H. Wu, C. K. Kao, B. Y. Chen, Y. S. Lin, M. Y. Li, and H. C. Wu, Appl. Phys. Lett. 0003-6951 93, 033511 (2008). 10.1063/1.2958238
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 033511
-
-
Wu, Y.H.1
Kao, C.K.2
Chen, B.Y.3
Lin, Y.S.4
Li, M.Y.5
Wu, H.C.6
-
11
-
-
18144384439
-
-
0031-9007,. 10.1103/PhysRevLett.94.146401
-
S. Shevlin, A. Curioni, and W. Andreoni, Phys. Rev. Lett. 0031-9007 94, 146401 (2005). 10.1103/PhysRevLett.94.146401
-
(2005)
Phys. Rev. Lett.
, vol.94
, pp. 146401
-
-
Shevlin, S.1
Curioni, A.2
Andreoni, W.3
-
13
-
-
51349107303
-
-
0003-6951,. 10.1063/1.2977555
-
P. Tsipas, S. Volkos, A. Sotiropoulos, S. Galata, G. Mavrou, D. Tsoutsou, Y. Panayiotatos, A. Dimoulas, C. Marchiori, and J. Fompeyrine, Appl. Phys. Lett. 0003-6951 93, 082904 (2008). 10.1063/1.2977555
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 082904
-
-
Tsipas, P.1
Volkos, S.2
Sotiropoulos, A.3
Galata, S.4
Mavrou, G.5
Tsoutsou, D.6
Panayiotatos, Y.7
Dimoulas, A.8
Marchiori, C.9
Fompeyrine, J.10
-
14
-
-
0842309718
-
-
0163-1918
-
C. Zhu, H. Hu, X. Yu, S. Kim, A. Chin, M. Li, B. Cho, and D. Kwong, Tech. Dig.-Int. Electron Devices Meet. 0163-1918 2003, 879.
-
Tech. Dig. - Int. Electron Devices Meet.
, vol.2003
, pp. 879
-
-
Zhu, C.1
Hu, H.2
Yu, X.3
Kim, S.4
Chin, A.5
Li, M.6
Cho, B.7
Kwong, D.8
-
15
-
-
0042665519
-
-
0026-2714,. 10.1016/S0026-2714(03)00177-X
-
C. Besset, S. Bruỳre, S. Blonkowski, S. Cŕmer, and E. Vincent, Microelectron. Reliab. 0026-2714 43, 1237 (2003). 10.1016/S0026- 2714(03)00177-X
-
(2003)
Microelectron. Reliab.
, vol.43
, pp. 1237
-
-
Besset, C.1
Bruỳre, S.2
Blonkowski, S.3
Cŕmer, S.4
Vincent, E.5
-
16
-
-
34547770804
-
-
0741-3106,. 10.1109/LED.2007.900876
-
K. C. Chiang, C. H. Cheng, K. Y. Jhou, H. C. Pan, C. N. Hsiao, C. P. Chou, S. P. McAlister, A. Chin, and H. L. Hwang, IEEE Electron Device Lett. 0741-3106 28, 694 (2007). 10.1109/LED.2007.900876
-
(2007)
IEEE Electron Device Lett.
, vol.28
, pp. 694
-
-
Chiang, K.C.1
Cheng, C.H.2
Jhou, K.Y.3
Pan, H.C.4
Hsiao, C.N.5
Chou, C.P.6
McAlister, S.P.7
Chin, A.8
Hwang, H.L.9
-
17
-
-
77955740852
-
-
0003-6951,. 10.1063/1.3455904
-
Y. H. Wu, M. L. Wu, J. R. Wu, and L. L. Chen, Appl. Phys. Lett. 0003-6951 97, 043503 (2010). 10.1063/1.3455904
-
(2010)
Appl. Phys. Lett.
, vol.97
, pp. 043503
-
-
Wu, Y.H.1
Wu, M.L.2
Wu, J.R.3
Chen, L.L.4
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