SCOPUS 정보 검색 플랫폼

Volumn 62, Issue 12, 2010, Pages 22-28

Characterization of polycrystalline materials using synchrotron X-ray imaging and diffraction techniques

(9) Ludwig, W a,b King, A c Herbig, M a Reischig, P b Marrow, J c Babout, L d Lauridsen, E M e Proudhon, H f Buffiere J Y a

a UNIVERSITÉ DE LYON (France)

b EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

c UNIVERSITY OF MANCHESTER (United Kingdom)

d LODZ UNIVERSITY OF TECHNOLOGY (Poland)

e TECHNICAL UNIVERSITY OF DENMARK (Denmark)

f PSL RESEARCH UNIVERSITY (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK DETECTION; DEFORMATION; DEGRADATION; DIFFRACTION; MICROSTRUCTURE; SYNCHROTRONS; THREE DIMENSIONAL; TOMOGRAPHY; X RAY ANALYSIS; X RAY DIFFRACTION; X RAYS;

3-D SHAPE; 3D IMAGING; COHERENCE PROPERTIES; DAMAGE MECHANISM; DEGRADATION MECHANISM; DIFFRACTION TECHNIQUES; ELASTIC STRAIN; ELECTRON DENSITIES; GRAIN MICROSTRUCTURE; IMAGING MODALITY; IN-SITU OBSERVATIONS; MECHANICAL TESTS; MICROMETER LENGTHS; PHASE-CONTRAST IMAGING; POLYCRYSTALLINE; POLYCRYSTALLINE SAMPLES; SYNCHROTRON BEAMS; SYNCHROTRON X RAYS; THIRD GENERATION; X-RAY DIFFRACTION IMAGING; XRAY IMAGING;

POLYCRYSTALLINE MATERIALS;

EID: 78650910226 PISSN: 10474838 EISSN: 15431851 Source Type: Journal
DOI: 10.1007/s11837-010-0176-6 Document Type: Review

Times cited : (36)

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