Attempts for molecular depth profiling directly on a rat brain tissue section using fullerene and bismuth cluster ion beams

International Journal of Mass Spectrometry

Volumn 260, Issue 2-3, 2007, Pages 115-120

  Debois, Delphine ^a   Brunelle, Alain ^a   Laprévote, Olivier ^a  

^a CNRS   (France)

Author keywords

Biological tissue; Depth profiling; Fullerene; Imaging mass spectrometry; Secondary ion mass spectrometry; Time of flight

Indexed keywords

EID: 33845873923     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2006.09.026     Document Type: Article

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