Taking a little off the top: Nanorod array morphology and growth studied by focused ion beam tomography

Langmuir

Volumn 26, Issue 22, 2010, Pages 17558-17567

  Krause, Kathleen M ^a   Vick, Douglas W ^b   Malac, Marek ^a,b   Brett, Michael J ^a,b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CONTINUOUS DATA; CORE STRUCTURE; CRITICAL PARAMETER; DEVICE APPLICATION; DUAL-BEAM; FIB/SEM; FOUNDATION MATERIALS; GLANCING ANGLE DEPOSITION; HIGH SURFACE AREA; HOMOGENEOUS STRUCTURE; INTERNAL MORPHOLOGY; LARGE ASPECT RATIO; MULTIPLE SAMPLES; NANO-COLUMNS; NANOCOLUMN; NANOROD ARRAYS; POPULATION DENSITIES; POROUS NATURE; POWER LAW SCALINGS; RECONSTRUCTION PROCESS; SEM; SYNTHESIS TECHNIQUES; TIO; TOP SURFACE;

ASPECT RATIO; FOCUSED ION BEAMS; MORPHOLOGY; POPULATION STATISTICS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; TOMOGRAPHY;

NANORODS;

EID: 78650358067     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la103070x     Document Type: Article

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