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Volumn 12, Issue , 2010, Pages
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Nanomanipulation of ridges in few-layer epitaxial graphene grown on the carbon face of 4H-SiC
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Author keywords
[No Author keywords available]
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Indexed keywords
AFM TIP;
ATOMIC FORCE MICROSCOPES;
CROSS-SECTION TRANSMISSION ELECTRON MICROSCOPIES;
EPITAXIAL GRAPHENE;
LATERAL DIRECTIONS;
NANOMANIPULATIONS;
SIC SUBSTRATES;
TEM;
GRAPHENE;
MICROMANIPULATORS;
NANOTECHNOLOGY;
SILICON CARBIDE;
TRANSMISSION ELECTRON MICROSCOPY;
EXPERIMENTS;
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EID: 78650132549
PISSN: 13672630
EISSN: None
Source Type: Journal
DOI: 10.1088/1367-2630/12/12/125009 Document Type: Article |
Times cited : (15)
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References (26)
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