Quantitative characterization of friction coefficient using lateral force microscope in the wearless regime

Review of Scientific Instruments

Volumn 75, Issue 2, 2004, Pages 415-421

  Bilas, P ^a   Romana, L ^a   Kraus, B ^a,b   Bercion, Y ^a   Mansot, J L ^a  

^a UNIVERSITÉ DES ANTILLES ET DE LA GUYANE   (France)

^b GATAN INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; CANTILEVER BEAMS; ELECTRIC POTENTIAL; FRICTION; MATHEMATICAL MODELS; PHOTODETECTORS; PHOTODIODES; SCANNING; SIGNALING; SILICON; STIFFNESS; TORSIONAL STRESS;

ADHESION FORCE; LATERAL FORCE MICROSCOPY (LFM);

ATOMIC PHYSICS;

EID: 1542572705     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1637436     Document Type: Article

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