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Volumn 2, Issue 10, 2002, Pages 1043-1046

Catalyst-Free Growth of Ordered Single-Walled Carbon Nanotube Networks

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EID: 0012305458     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0256309     Document Type: Article
Times cited : (105)

References (23)
  • 2
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    • Special issue on Carbon Nanotubes
    • Special issue on Carbon Nanotubes, Phys. World, 2000, 13(6).
    • (2000) Phys. World , vol.13 , Issue.6
  • 9
    • 0032578904 scopus 로고    scopus 로고
    • Kong, J.; Soh, H. T.; Cassell, A. M.; Quate, C. F.; Dai, H. Nature 1998, 395, 878. Fan, S.; Chapline, M. G.; Franklin, N. R.; Tombler, T. W.; Cassell, A. M.; Dai, H. Science 1999, 283, 512.
    • (1998) Nature , vol.395 , pp. 878
    • Kong, J.1    Soh, H.T.2    Cassell, A.M.3    Quate, C.F.4    Dai, H.5
  • 14
    • 0348106608 scopus 로고    scopus 로고
    • note
    • Analysis of the SiC wafers by Sterling Semiconductor indicates that they do not contain measurable amounts of metal impurities. The concentrations are lower than the resolution of their glow discharge mass spectrometry experiments (e.g., <0.005 ppm for Co and <0.01 ppm for Ni).
  • 15
    • 0348106606 scopus 로고    scopus 로고
    • note
    • Secondary ion mass spectrometry (SIMS) experiments show that no molybdenum from the sample holder clips diffuses on the sample during the annealing.
  • 17
    • 0031912473 scopus 로고    scopus 로고
    • Wildöer, J. W. G.; Venema, L. C.; Rinzler, A. G.; Smalley, R. E.; Dekker, C. Nature 1998, 391, 59; Odom, T. W.; Huang, J.; Kim, P.; Lieber, C. M. Nature 1998, 391, 62.
    • (1998) Nature , vol.391 , pp. 62
    • Odom, T.W.1    Huang, J.2    Kim, P.3    Lieber, C.M.4
  • 18
    • 0032484754 scopus 로고    scopus 로고
    • The AFM is used in noncontact mode for imaging. To manipulate, the tip is brought closer to the surface and moved laterally as described by Hertel, T.; Martel, R.; Avouris, Ph. J. Phys. Chem. B 1998, 102, 910.
    • (1998) J. Phys. Chem. B , vol.102 , pp. 910
    • Hertel, T.1    Martel, R.2    Avouris, Ph.3
  • 20
    • 0011379910 scopus 로고
    • and references therein
    • Xhie, J.; Sattler, K.; Ge, M.; Venkateswaran, N. Phys. Rev. B 1993, 47, 15835; Rong, Z. Y.; Kuiper, P. Phys. Rev. B 1993, 48, 17427 and references therein.
    • (1993) Phys. Rev. B , vol.48 , pp. 17427
    • Rong, Z.Y.1    Kuiper, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.