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Journal of Physics D: Applied Physics

Volumn 43, Issue 50, 2010, Pages

Transport behaviours and nanoscopic resistance profiles of electrically stressed Pt/TiO2/Ti planar junctions

(3) Kim, Haeri a Kim, Dong Wook a Phark, Soo Hyon b

a Ewha Womans University (South Korea)

b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COATED TIPS; ELECTRICAL STRESS; ELECTROSTATIC FORCE MICROSCOPY; PLANAR JUNCTIONS; RESISTANCE PROFILES; TIME EVOLUTIONS; TRANSPORT BEHAVIOUR; TRANSPORT CHARACTERISTICS;

ELECTRODES; ELECTROSTATIC FORCE; PLATINUM; SCANNING PROBE MICROSCOPY;

ELECTRIC FORCE MICROSCOPY;

EID: 78650099635 PISSN: 00223727 EISSN: 13616463 Source Type: Journal
DOI: 10.1088/0022-3727/43/50/505305 Document Type: Article

Times cited : (4)

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