Structural and chemical characterization of TiO2 memristive devices by spatially-resolved NEXAFS

Nanotechnology

Volumn 20, Issue 48, 2009, Pages

  Strachan, John Paul ^a   Joshua Yang, J ^a   Münstermann, Ruth ^a   Scholl, Andreas ^b   Medeiros Ribeiro, Gilberto ^a   Stewart, Duncan R ^a   Stanley Williams, R ^a  

^a HEWLETT PACKARD LABORATORIES   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS POLARITY; CHEMICAL CHARACTERIZATION; METAL DEVICES; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURES; REDUCTION/OXIDATION; RESISTIVE SWITCHING; RESULTING MATERIALS; SOFT-X-RAY ABSORPTION; SPATIAL RESOLUTION; STRUCTURAL CHANGE; TIO;

ABSORPTION; CHEMICAL PROPERTIES; X RAY ABSORPTION;

ABSORPTION SPECTROSCOPY;

TITANIUM DIOXIDE;

ABSORPTION SPECTROSCOPY; ARTICLE; MICROSCOPY; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; OXIDATION REDUCTION REACTION; PRIORITY JOURNAL;

EID: 70449806473     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/48/485701     Document Type: Article

References (22)

1. Dearnaley G, Stoneham A M and Morgan D V 1970 Rep. Prog. Phys. 33 1129
2. Waser R and Aono M 2007 Nat. Mater. 6 833
3. Sawa A 2008 Mater. Today 11 28
4. Strukov D B, Snider G S, Stewart D R and Williams R S 2008 Nature 453 80
5. Chua L O 1971 IEEE Trans. Circuit Theory 18 507
6. Stöhr J 1992 NEXAFS Spectroscopy (Berlin: Springer)
7. Ade H and Stoll H 2009 Nat. Mater. 8 281
8. Janousch M, Meijer G I, Staub U, Delley U, Karg S F and Andreasson B P 2007 Adv. Mater. 19 2232
9. Andreasson B P, Janousch M, Staub U, Meijer G I and Delley B 2007 Mater. Sci. Eng. B 144 60
10. Andreasson B P, Janousch M, Staub U and Meijer G I 2009 Appl. Phys. Lett. 94 013513
11. Anders S, Padmore H A, Duarte R M, Renner T, Stammler T, Scholl A, Scheinfein M R, Stöhr J, Seve L and Sinkovic B 1999 Rev. Sci. Instrum. 70 3973
12. Yang J J, Pickett M D, Li X, Ohlberg D A, Stewart D R and Williams R S 2008 Nat. Nanotechnol. 3 429
13. Yang J J, Miao F, Pickett M D, Ohlberg D A, Stewart D R, Lau C N and Williams R S 2009 Nanotechnology 20 215201
14. van der Laan G 1990 Phys. Rev. B 41 12366
15. Soriano L, Fuentes G G, Quirós C, Trigo J F, Sanz J M, Bressler P R and Gonzlez-Elipe A R 2000 Langmuir 16 7066
16. de Groot F M F, Fuggle J C, Thole B T and Sawatzky G A 1990 Phys. Rev. B 42 5459
17. de Groot F M F, Figueiredo M O, Basto M J, Abbate M, Petersen H and Fuggle J C 1992 Phys. Chem. Miner. 19 140
18. Ranade M R, Navrotsky A, Zhang H Z, Banfield J F, Elder S H, Zaban A, Borse P H, Kulkarni S K, Doran G S and Whitfield H J 2002 Proc. Natl Acad. Sci. 99 6476
19. Lusvardi V S, Barteau M A, Chen J G, Eng J, Frühberger B and Teplyakov A 1998 Surf. Sci. 397 237
20. Sharpe R G and Palmer R E 1996 J. Phys. D: Appl. Phys. 29 837-42
21. Jeong D S, Schroeder H, Breuer U and Waser R 2008 J. Appl. Phys. 104 123716
22. Borghetti J, et al. 2009 J. Appl. Phys. at press