High-precision determination of residual stress of polycrystalline coatings using optimised XRD-sin2ψ technique

Surface and Coatings Technology

Volumn 205, Issue 5, 2010, Pages 1403-1408

  Luo, Q ^a   Jones, A H ^a  

^a SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

Author keywords

PVD hard coatings; Residual stress measurement; Shot peening hardening; Thermal barrier coatings; X ray diffraction

Indexed keywords

BROAD DIFFRACTION PEAK; DIFFRACTION ANGLE; DIFFRACTION PEAKS; HIGH PRECISION; HIGH-PRECISION MEASUREMENT; INTENSITY METHODS; MAXIMUM INTENSITIES; MIDDLE POINTS; NUMBER OF SAMPLES; POLYCRYSTALLINE; PVD HARD COATINGS; SURFACE RESIDUAL STRESS; THERMAL BARRIER; TRANSITION METAL NITRIDES; TRIBOLOGICAL PERFORMANCE; TWO PARAMETER; VALUE DETERMINATION; XRD;

DIFFRACTION; ELECTRON BEAMS; HARDENING; INSTRUMENTS; LINEAR REGRESSION; MAGNETRONS; MECHANICAL PROPERTIES; NITRIDES; RESIDUAL STRESSES; SHOT PEENING; STRESS MEASUREMENT; THERMAL BARRIER COATINGS; TRANSITION METALS; X RAY DIFFRACTION;

HARD COATINGS;

EID: 78649951008     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2010.07.108     Document Type: Article

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