Adsorption of benzene on Si(001) from noncontact atomic force microscopy simulation

Japanese Journal of Applied Physics

Volumn 47, Issue 7 PART 3, 2008, Pages 6092-6095

  Masago, Akira ^a   Watanabe, Satoshi ^a   Tagami, Katsunori ^a   Tsukada, Masaru ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b WASEDA UNIVERSITY   (Japan)

Author keywords

Si(001) c(4 2); Topographic line profile; Van der waals force

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; BENZENE; BRIDGES; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY; SILICON; VAN DER WAALS FORCES;

A STABLES; ADSORPTION STRUCTURES; ATOMIC CONFIGURATIONS; DENSITYFUNCTIONAL; LINE PROFILES; LINE SCANS; NONCONTACT ATOMIC FORCE MICROSCOPIES; SI DIMERS; SI(0 0 1) SURFACES; SI(001); STABLE STRUCTURES; TOPOGRAPHIC LINE PROFILE; ZERO TEMPERATURES;

CRYSTAL ATOMIC STRUCTURE;

EID: 55149104804     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.6092     Document Type: Article

References (15)

1. Y. Sugimoto, M. Abe, S. Hirayama, N. Oyabu, O. Custance, and S. Morita: Nat. Mater. 4 (2005) 156.
2. T.-C. Shen, C. Wang, and J. R. Tucker: Phys. Rev. Lett. 78 (1997) 1271.
3. X.-L. Guo, Z.-C. Dong, A. S. Trifononv, K. Miki, Y. Wakayama, D. Fujita, K. Kimura, S. Yokoyama, and S. Mashiko: Phys. Rev. B 70 (2004) 233204.
4. F. Jäckel, M. D. Watson, K. Müllen, and J. P. Rabe: Phys. Rev. Lett. 92 (2004) 188303.
5. N. Sasaki, S. Watanabe, and M. Tsukada: Phys. Rev. Lett. 28 (2002) 046106.
6. M. Shitnomura, M. Munakata, K. Honma, S. M. Widstrand, L. Johansson, T. Abukawa, and S. Kono: Surf. Rev. Lett. 10 (2003) 499.
7. W. A. Hofer, A. J. Fisher, G. P. Lopinski, and R. A. Wolkow: Phys. Rev. B 63 (2001) 085314.
8. P. L. Silvestrelli: Phys. Rev. B 62 (2000) 1596.
9. A. Masago, S. Watanabe, K. Tagami, and M. Tsukada: e-J. Surf. Sci. Nanotechnol. 4 (2006) 1.
10. M. Elstner, D. Porezag, G. Jungnickel, J. Elstner, M. Haugk, T. Frauenheim, S. Suhai, and G. Seifert: Phys. Rev. B 58 (1998) 7260.
11. K. Tagami and M. Tsukada: Jpn. J. Appl. Phys. 39 (2000) 6025.
12. R. Pérez, U. Štich, M. C. Payne, and K. Terakura: Phys. Rev. B 58 (1998) 10835.
13. R. Pérez, M. C. Payne, U. Štich, and K. Terakura: Phys. Rev. Lett. 78 (1997) 678.
14. N. Sasaki and M. Tsukada: Appl. Phys. A 72 (2001) S39.
15. N. Sasaki and M. Tsukada: Jpn. J. Appl. Phys. 37 (1998) L533.