-
1
-
-
36348970075
-
Stress relaxation characterization of hypoeutectic sn3.0ag0.5cu pb-free solder: Experiment and modeling
-
London, April
-
Cuddalorepatta, G., Dasgupta, A., "Stress Relaxation Characterization of Hypoeutectic Sn3.0Ag0.5Cu Pb-free Solder: Experiment and Modeling", EuroSimE Conference, IEEE Components, Packaging, Manufacturing and Technology Society, London, April 2007
-
(2007)
EuroSimE Conference, IEEE Components, Packaging, Manufacturing and Technology Society
-
-
Cuddalorepatta, G.1
Dasgupta, A.2
-
2
-
-
24644471649
-
-
Ph.D. Dissertation, University of Maryland, College Park, MD, USA
-
Zhang, Q., 2004, "Isothermal Mechanical and Thermomechanical Durability Characterization of Selected Pb-Free Solders", Ph.D. Dissertation, University of Maryland, College Park, MD, USA
-
(2004)
Isothermal Mechanical and Thermomechanical Durability Characterization of Selected Pb-Free Solders
-
-
Zhang, Q.1
-
3
-
-
0942299489
-
Effect of silver content on thermal fatigue life of snxag-0.5cu flip-chip interconnects
-
Terashima, S., Kariya, Y., Hosoi, T., and Tanaka, M.,"Effect of Silver Content on Thermal Fatigue Life of SnxAg-0.5Cu Flip-Chip Interconnects," Journal of Electronic Materials, Vol. 32, No.12, (2003), pp. 1527-1533
-
(2003)
Journal of Electronic Materials
, vol.32
, Issue.12
, pp. 1527-1533
-
-
Terashima, S.1
Kariya, Y.2
Hosoi, T.3
Tanaka, M.4
-
4
-
-
6344278527
-
Microstructure and creep behavior of eutectic SnAg and SnAgCu solders
-
Wiese, S., and Wolter, K.-J., "Microstructure and creep behavior of eutectic SnAg and SnAgCu solders", Microelectronics Reliability, Vol. 44, (2004),pp. 1923 -1931
-
(2004)
Microelectronics Reliability
, vol.44
, pp. 1923-1931
-
-
Wiese, S.1
Wolter, K.-J.2
-
5
-
-
2442575860
-
The microstructure, thermal fatigue, and failure analysis of near-ternary eutectic sn-Ag-cu solder joints
-
Kang, S.K., Lauro, P., Shih, D., Henderson, D.W., "The Microstructure, Thermal Fatigue, and Failure Analysis of Near-Ternary Eutectic Sn-Ag-Cu Solder Joints", Material Transactions, 45(3), (2004), pp. 695-702
-
(2004)
Material Transactions
, vol.45
, Issue.3
, pp. 695-702
-
-
Kang, S.K.1
Lauro, P.2
Shih, D.3
Henderson, D.W.4
-
6
-
-
33750285340
-
Reliability of the aging lead free solder joint
-
Ma, H., et al, "Reliability of the Aging Lead Free Solder Joint", IEEE ECTC Proceedings, 2006
-
(2006)
IEEE ECTC Proceedings
-
-
Ma, H.1
-
7
-
-
2342465577
-
Low-cycle fatigue characteristics of sn-based solder joints
-
Lee, K. O., Yu, J., Park, T. S., and Lee, S.B., 2004, "Low -Cycle Fatigue Characteristics of Sn-Based Solder Joints", Journal of. Electronic Materials, 33, pp. 249-257
-
(2004)
Journal Of. Electronic Materials
, vol.33
, pp. 249-257
-
-
Lee, K.O.1
Yu, J.2
Park, T.S.3
Lee, S.B.4
-
8
-
-
0035455438
-
Assessment of low-cycle fatigue life of sn-3.5mass%Ag-X (X=Bi or Cu) alloy by strain range partitioning approach
-
Kariya, Y., Morihata, T., Hazawa, E., and Otsuka, M., 2001, "Assessment of Low-Cycle Fatigue Life of Sn-3.5mass%Ag-X (X=Bi or Cu) Alloy by Strain Range Partitioning Approach," Journal of Electronic Materials, 30(9), pp. 1184-1189
-
(2001)
Journal of Electronic Materials
, vol.30
, Issue.9
, pp. 1184-1189
-
-
Kariya, Y.1
Morihata, T.2
Hazawa, E.3
Otsuka, M.4
-
9
-
-
2342640135
-
Effect of silver content on the shear fatigue properties of Sn-Ag-Cu flip-chip interconnects
-
Kariya, Y., Hosoi, T., Terashima, S., Tanaka, M., Otsuka, M., 2004, "Effect of silver content on the shear fatigue properties of Sn-Ag-Cu flip-chip interconnects", Journal of Electronic Materials, 33 (4), pp. 321-328
-
(2004)
Journal of Electronic Materials
, vol.33
, Issue.4
, pp. 321-328
-
-
Kariya, Y.1
Hosoi, T.2
Terashima, S.3
Tanaka, M.4
Otsuka, M.5
-
10
-
-
13244267364
-
Cyclic softening of the Sn-3.8Ag-0.7Cu lead-free solder alloy with equiaxed grain structure
-
Zeng, Q. L., Wang, Z.G., Xian, A. P., and. Shang, J. K, 2005 " Cyclic Softening of the Sn-3.8Ag-0.7Cu Lead-Free Solder Alloy with Equiaxed Grain Structure," Journal of. Electronic Materials, 34, pp. 62-67
-
(2005)
Journal Of. Electronic Materials
, vol.34
, pp. 62-67
-
-
Zeng, Q.L.1
Wang, Z.G.2
Xian, A.P.3
Shang, J.K.4
-
12
-
-
0348126794
-
-
Ph.D. Dissertation, University of Maryland, College Park, MD, USA
-
Haswell, P., 2001, "Durability Assessment and Microstructural Observations of Selected Solder Alloys", Ph.D. Dissertation, University of Maryland, College Park, MD, USA
-
(2001)
Durability Assessment and Microstructural Observations of Selected Solder Alloys
-
-
Haswell, P.1
-
13
-
-
1142263920
-
The effect of solder paste composition on the reliability of SnAgCu joints
-
Nurmi, S., Sundelin, J., Ristolainen, E., Lepisto, T., 2004, "The Effect of Solder Paste Composition on the Reliability of SnAgCu joints", Microelectronics Reliability, 44, pp. 485-494
-
(2004)
Microelectronics Reliability
, vol.44
, pp. 485-494
-
-
Nurmi, S.1
Sundelin, J.2
Ristolainen, E.3
Lepisto, T.4
-
15
-
-
84928624611
-
-
Ohguchi, K., Journal of Electronic Materials, Vol. 35, No.1, 2006, pp. 13
-
(2006)
Journal of Electronic Materials
, vol.35
, Issue.1
, pp. 13
-
-
Ohguchi, K.1
-
16
-
-
0036698732
-
-
Song, H.G., Material Transactions, Vol. 43, No.8, 2002, pp. 1847
-
(2002)
Material Transactions
, vol.43
, Issue.8
, pp. 1847
-
-
Song, H.G.1
-
18
-
-
0001143029
-
New accurate procedure for single shear testing of metals
-
September 1967
-
Iosipescu, N., September 1967, "New Accurate Procedure for Single Shear Testing of Metals," J. Materials, Vol. 2, No. 3, pp. 537-566
-
J. Materials
, vol.2
, Issue.3
, pp. 537-566
-
-
Iosipescu, N.1
-
19
-
-
0032022812
-
A finite-element and experimental analysis of stress distribution in various shear tests for solder joints
-
Reinkainen, T., Poech, M., Krumm, M., Kivilahti, J., 1998, "A finite-element and experimental analysis of stress distribution in various shear tests for solder joints." Journal of Electronic Packaging, Transactions ASME,. 120 (1), pp. 106-113
-
(1998)
Journal of Electronic Packaging, Transactions ASME
, vol.120
, Issue.1
, pp. 106-113
-
-
Reinkainen, T.1
Poech, M.2
Krumm, M.3
Kivilahti, J.4
-
21
-
-
44249117189
-
Grain features of snagcu solder and their effect on mechanical behavior of microjoints
-
Gong, J., Liu, C., Conway, P., "Grain Features of SnAgCu Solder and their Effect on Mechanical Behavior of Microjoints", ECTC IEEE Conference, 2006
-
(2006)
ECTC IEEE Conference
-
-
Gong, J.1
Liu, C.2
Conway, P.3
-
23
-
-
44249086238
-
Grain Formation and Intergrain Stresses in a Sn-Ag-Cu Solder Ball
-
San Franscisco
-
Park, S., Dhakal, R., et.al., "Grain Formation and Intergrain Stresses in a Sn-Ag-Cu Solder Ball", InterPACK, San Franscisco, 2005
-
(2005)
InterPACK
-
-
Park, S.1
Dhakal, R.2
|