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Volumn 21, Issue 18, 2010, Pages 2156-2164

Ultra-precision grinding technology and grinder of silicon wafers

Author keywords

Back thinning; Grinder; Low damage grinding; Planarization; Silicon wafer; Ultra precision grinding

Indexed keywords


EID: 78049301699     PISSN: 1004132X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.