Mutation analysis with high-level decision diagrams

LATW2010 - 11th Latin-American Test Workshop

Volumn , Issue , 2010, Pages

  Hantson, Hanno ^a   Raik, Jaan ^a   Jenihhin, Maksim ^a   Chepurov, Anton ^a   Ubar, Raimund ^a   Di Guglielmo, Giuseppe ^b   Fummi, Franco ^b  

^a TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

^b UNIVERSITY OF VERONA   (Italy)

Author keywords

Decision diagrams; Mutation analysis

Indexed keywords

DECISION DIAGRAM; MUTATION ANALYSIS; MUTATION OPERATORS; SPEED-UPS; SYSTEM MODELS; VERIFICATION ENVIRONMENT;

GRAPHIC METHODS;

SOFTWARE TESTING;

EID: 77958126653     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/LATW.2010.5550336     Document Type: Conference Paper

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