Observability statement coverage based on dynamic factored use-definition chains for functional verification

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 22, Issue 3, 2006, Pages 273-285

  Lv, Tao ^a   Fan, Jian Ping ^a   Li, Xiao Wei ^a   Liu, Ling Yi ^a  

^a INSTITUTE OF COMPUTING TECHNOLOGY   (China)

Author keywords

Coverage metrics; Data flow analysis; Design verification; Dynamic factored use definition chains; Observability

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; COMPUTER HARDWARE; DATA FLOW ANALYSIS; DATA STRUCTURES; INTEGRATED CIRCUIT LAYOUT; OBSERVABILITY;

COVERAGE METRICS; DATA-FLOW ANALYSIS; DESIGN VERIFICATION; DYNAMIC FACTORED USE-DEFINITION CHAINS;

ELECTRONIC EQUIPMENT TESTING;

EID: 33747883798     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/s10836-006-8634-3     Document Type: Conference Paper

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