From specification validation to hardware testing: A unified method

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 885-893

  Al Hayek, Ghassan ^a   Robach, Chantal ^a  

^a LSR IMAG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER HARDWARE; COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SOFTWARE; ELECTRIC FAULT CURRENTS; GATES (TRANSISTOR); HEURISTIC METHODS; INTEGRATED CIRCUIT TESTING;

AUTOMATIC TEST PATTERN GENERATION (ATPG); MUTATION ANALYSIS;

VLSI CIRCUITS;

EID: 0030400760     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)