High-level decision diagrams based coverage metrics for verification and test

2009 10th Latin American Test Workshop, LATW 2009

Volumn , Issue , 2009, Pages

  Jenihhin, Maksim ^a   Raik, Jaan ^a   Chepurov, Anton ^a   Reinsalu, Uljana ^a   Ubar, Raimund ^a  

^a TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

Author keywords

[No Author keywords available]

Indexed keywords

CODE COVERAGE; CONDITION COVERAGE; COVERAGE METRICS; DECISION DIAGRAM; HARDWARE DESCRIPTION LANGUAGES; HIERARCHICAL APPROACH; METRIC ANALYSIS; MODEL-BASED; STRUCTURAL COVERAGE ANALYSIS; TEST GENERATIONS;

TESTING;

COMPUTER HARDWARE DESCRIPTION LANGUAGES;

EID: 67649880544     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/LATW.2009.4813792     Document Type: Conference Paper

References (10)

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3. K. Minakova, U. Reinsalu, A. Chepurov, J. Raik, M. Jenihhin, R.Ubar, P. Ellervee, ̃High-Level Decision Diagram Manipulations for Code Coverage Analysis̃, BEC 2008 Tallinn, Estonia, October 2008, pp. 207-210
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