Crystal-induced effects at crystal/amorphous interfaces: The case of Si3N4/SiO2

Physical Review B - Condensed Matter and Materials Physics

Volumn 82, Issue 8, 2010, Pages

  Walkosz, Weronika ^a   Klie, Robert F ^a   Öǧüt, Serdar ^a   Mikijelj, Biljana ^b   Pennycook, Stephen J ^c,d   Pantelides, Sokrates T ^c,d   Idrobo, Juan C ^a,c,d  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b Ceradyne Inc   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957554404     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.081412     Document Type: Article

References (28)

1. R. W. Cahn, P. Hassen, and E. J. Kramer, Materials Science and Technology, Structure and Properties of Ceramics (Wiley-VCH, Weinheim, 1994), p. 751.
2. P. F. Becher, G. S. Painter, E. Y. Sun, C. H. Hsueh, and M. J. Lance, Acta Mater. 48, 4493 (2000). 10.1016/S1359-6454(00)00236-6
3. M. J. Hoffmann and G. Petzow, Tailoring of Mechanical Properties of Si 3 N 4 Ceramics, NATO ASI Series E, Applied Sciences Vol. 276 (Kluwer Academic, Dordrecht, 1994).
4. R. L. Satet and M. J. Hoffmann, J. Am. Ceram. Soc. 88, 2485 (2005). 10.1111/j.1551-2916.2005.00421.x
5. R. L. Satet, M. J. Hoffmann, and R. M. Cannon, Mater. Sci. Eng., A 422, 66 (2006). 10.1016/j.msea.2006.01.015
6. P. F. Becher, G. S. Painter, N. Shibata, R. L. Satet, M. J. Hoffmann, and S. J. Pennycook, Mater. Sci. Eng. A 422, 85 (2006). 10.1016/j.msea.2006.01.006
7. P. F. Becher, G. S. Painter, N. Shibata, S. B. Waters, and H.-T. Lin, J. Am. Ceram. Soc. 91, 2328 (2008). 10.1111/j.1551-2916.2008.02448.x
8. N. Shibata, G. S. Painter, P. F. Becher, and S. J. Pennycook, Appl. Phys. Lett. 89, 051908 (2006). 10.1063/1.2245212
9. N. Shibata, S. J. Pennycook, T. R. Gosnell, G. S. Painter, W. A. Shelton, and P. F. Becher, Nature (London) 428, 730 (2004). 10.1038/nature02410
10. A. Ziegler, J. C. Idrobo, M. K. Cinibulk, C. Kisielowski, N. D. Browning, and R. O. Ritchie, Science 306, 1768 (2004). 10.1126/science.1104173
11. G. B. Winkelman, C. Dwyer, T. S. Hudson, D. Nguyen-Manh, M. Döblinger, R. L. Satet, M. J. Hoffmann, and D. J. H. Cockayne, Philos. Mag. Lett. 84, 755 (2004). 10.1080/09500830500041302
12. A. Ziegler, J. C. Idrobo, M. K. Cinibulk, C. Kisielowski, N. D. Browning, and R. O. Ritchie, Appl. Phys. Lett. 88, 041919 (2006). 10.1063/1.2168021
13. G. B. Winkelman, C. Dwyer, C. Marsh, T. S. Hudson, D. Nguyen-Manh, M. Döblinger, and D. J. H. Cockayne, Mater. Sci. Eng., A 422, 77 (2006). 10.1016/j.msea.2006.01.003
14. K. van Benthem, G. S. Painter, F. W. Averill, S. J. Pennycook, and P. F. Becher, Appl. Phys. Lett. 92, 163110 (2008). 10.1063/1.2917566
15. W. Walkosz, R. F. Klie, S. Öǧüt, A. Borisevish, P. F. Becher, S. J. Pennycook, and J. C. Idrobo, Appl. Phys. Lett. 93, 053104 (2008). 10.1063/1.2968683
16. S. H. Garofalini and W. W. Luo, J. Am. Ceram. Soc. 86, 1741 (2003). 10.1111/j.1151-2916.2003.tb03549.x
17. J. Chen, L. Ouyang, P. Rulis, A. Misra, and W. Y. Ching, Phys. Rev. Lett. 95, 256103 (2005). 10.1103/PhysRevLett.95.256103
18. M. Yoshiya, K. Tatsumi, I. Tanaka, and H. Adachi, J. Am. Ceram. Soc. 85, 1 (2002).
19. W. Y. Ching, P. Rulis, L. Ouyang, S. Aryal, and A. Misra, Phys. Rev. B 81, 214120 (2010). 10.1103/PhysRevB.81.214120
20. T. Marten, E. I. Isaev, B. Alling, L. Hultman, and I. A. Abrikosov, Phys. Rev. B 81, 212102 (2010). 10.1103/PhysRevB.81.212102
21. J. C. Idrobo, H. Iddir, S. Öǧüt, A. Ziegler, N. D. Browning, and R. O. Ritchie, Phys. Rev. B 72, 241301 (2005). 10.1103/PhysRevB.72.241301
22. W. Walkosz, J. C. Idrobo, R. F. Klie, and S. Öǧüt, Phys. Rev. B 78, 165322 (2008). 10.1103/PhysRevB.78.165322
23. T. Zheleva, A. Lelis, G. Duscher, F. Liu, I. Levin, and M. Das, Appl. Phys. Lett. 93, 022108 (2008). 10.1063/1.2949081
24. R. F. Egerton, Electron Energy Loss Spectroscopy in the Electron Microscope (Plenum, New York, 1996).
25. S. Veprek, P. Karvankova, and M. G. J. Veprek-Heijman, J. Vac. Sci. Technol. B 23, L17 (2005). 10.1116/1.2131086
26. M. H. White, D. A. Adams, and J. Bu, IEEE Circuits Devices Mag. 16, 22 (2000). 10.1109/101.857747
27. L. Liu, J. P. Xu, L. L. Chen, and P. T. Lai, Microelectron. Reliab. 49, 912 (2009). 10.1016/j.microrel.2009.05.010
28. A. Kazmierczak, F. Dortu, O. Schrevens, D. Giannone, L. Vivien, D. Marris-Morini, D. Bouville, E. Cassan, K. B. Gylfason, H. B. Sohlström, B. Sanchez, A. Griol, and D. Hill, Opt. Eng. 48, 014401 (2009). 10.1117/1.3067875