Atomic-resolution observations of semicrystalline intergranular thin films in silicon nitride

Applied Physics Letters

Volumn 88, Issue 4, 2006, Pages 1-3

  Ziegler, A ^a,b   Idrobo, J C ^c   Cinibulk, M K ^d   Kisielowski, C ^a   Browning, N D ^a,e   Ritchie, R O ^a,f  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d AIR FORCE RESEARCH LABORATORY   (United States)

^e University of California   (United States)

^f University of California Berkeley   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC STRUCTURE; CREEP RESISTANCE; NANOSCALE INTERGRANULAR FILMS; SEMICRYSTALLINE STRUCTURE;

CERAMIC MATERIALS; CRYSTAL ATOMIC STRUCTURE; CRYSTALLINE MATERIALS; DOPING (ADDITIVES); GRANULAR MATERIALS; SILICON NITRIDE;

THIN FILMS;

EID: 31544449758     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2168021     Document Type: Article

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