Optimal tilt magnitude determination for aberration-corrected super resolution exit wave function reconstruction

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 367, Issue 1903, 2009, Pages 3755-3771

  Haigh, S J ^a   Sawada, H ^b   Kirkland, Angus I ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b JEOL LTD   (Japan)

Author keywords

Aberration correction; Aperture synthesis; Exit wave function reconstruction

Indexed keywords

ABERRATIONS; ELECTRON MICROSCOPES; IMAGE ENHANCEMENT; REPAIR; TRANSMISSION ELECTRON MICROSCOPY; WAVE FUNCTIONS;

ABERRATION CORRECTION; APERTURE SYNTHESIS; CORRECTED IMAGE; DATA SETS; EXIT WAVE FUNCTION RECONSTRUCTION; EXPERIMENTAL DATA ACQUISITION; ILLUMINATION CONDITIONS; INFORMATION TRANSFERS; INSTRUMENTAL PARAMETERS; OPTICAL ABERRATION; RESOLUTION IMPROVEMENT; SINGLE IMAGES; SPATIAL FREQUENCY; SUPER RESOLUTION; TEM; TILT ANGLE; TRANSMISSION ELECTRON MICROSCOPE;

IMAGE RECONSTRUCTION;

EID: 70349414553     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.2009.0124     Document Type: Article

References (36)

1. Foschepoth, M. & Kohl, H. 1998 Amplitude contrast---a way to obtain directly interpretable high-resolution images in a spherical aberration corrected transmission electron microscope. Phys. Status Solidi A 166, 357-366. (doi:10.1002/(SICI)1521-396X(199803)166:1<357::AID-PSS A357>3.0.CO;2-F)
2. Haider, M., Braunshausen, G. & Schwan, E. 1995 Correction of the spherical aberration of a 200 kV TEM by means of a hexapole corrector. Optik 99, 167.
3. Haider, M., Uhlemann, S., Schwan, E., Rose, H., Kabius, B. & Urban, K. 1998a Electron microscopy image enhanced. Nature 392, 768. (doi:10.1038/33823)
4. Haider, M. Rose, H., Uhlemann, S., Kabius, B. & Urban, K. 1998b Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope J. Electron Microsc. 47, 395.
5. Haider, M., Uhlemann, S. & Zach, J. 2000 Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM. Ultramicroscopy 81, 163-175. (doi:10.1016/S0304-3991(99)00194-1)
6. Hopkins, H. H. 1953 On the diffraction theory of optical images. Proc. R. Soc. Lond. A 217, 408-432. (10.1098/rspa.1953.0071)
7. Houfien, L. 2006 Aberration-corrected HRTEM of defects in strained La2CuO4 thin films grown on SrTiO3. J. Mater. Sci. 41, 4413-4419. (doi:10.1007/S10853-006-0151-3)
8. Houfien, L. Thust, A. & Urban, K. 2006 Atomic-precision determination of the reconstruction of a 90 tilt boundary in YBa2Cu3O7 by aberration corrected HRTEM. Ultramicroscopy 106, 200-214. (doi:10.1016/j.ultramic.2005.07. 009)
9. Hutchison, J. L., Titchmarsh, J. M., Cockayne, D. J. H., Doole, R. C., Hetherington, C. J. D. H., Kirkland, A. I. & Sawada, H. 2005 A versatile double aberration corrected, energy filtered TEM/STEM for materials science. Ultramicroscopy 103, 7-15. (doi:10.1016/j.ultramic.2004.11.010)
10. Kirkland, A. I. & Meyer, R. R. 2004 Indirect high-resolution transmission electron microscopy: aberration measurement and wave function reconstruction. Microsc. Microanal. 10, 401-413. (doi:10.1017/S14319276040437)
11. Kirkland, A. I., Saxton, W. O., Chau, K.-L., Tsuno, K. & Kawasaki, M. 1995 Superresolution by aperture synthesis---tilt series reconstruction in CTEM. Ultramicroscopy 57, 355-374. (doi:10.1016.0304-3991(94)0091-0)
12. Kirkland, A. I., Saxton, W. O. & Chand, G. 1997 Multiple beam tilt microscopy for super resolved imaging. J. Electron Microsc. 1, 11-22.
13. Kirkland, A. I., Meyer, R. R. & Chang, L. Y. 2006 Local measurement and computational refinement of aberrations for HRTEM. Microsc. Microanal. 12, 461-468. (doi:10.1017/S14319276060612)
14. Lentzen, M. 2004 The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imaging. Ultramicroscopy 99, 211-220. (doi:10.1016/j.ultramic.2003.12.007)
15. Lentzen, M., Jahnen, B., Jia, C. L., Thust, A., Tillmann, K. & Urban, K. 2002 High-resolution imaging with an aberration-corrected transmission electron microscope. Ultramicroscopy 92, 233-242. (doi:10.1016/S0304-3991(02) 00139-0) (Pubitemid 34721350)
16. Lovely, G. R., Brown, A. P., Brydson, R., Kirkland, A. I., Meyer, R. R., Chang, L., Jefferson, M.,Falke, A. & Bleloch, A. 2006 Observation of octahedral cation coordination on the 111 surfaces of iron oxide nanoparticles. Appl. Phys. Lett. 88, 093124. (doi:10.1063/1.2175481)
17. Meyer, R. R. 2002 Quantitative automated object wave restoration in high resolution electron microscopy. Doctor rerum naturalium, Technischen Universitat Dresden.
18. Meyer, R. R. & Kirkland, A. I. 2000 Characterisation of the signal and noise transfer of CCD cameras for electron detection. Microsc. Res. Techniq. 49, 269-280. (doi:10.1002/(SICI)1097-0029(20000501)49:3<269::AID-JEMT5>3. 0.CO;2-B)
19. Meyer, R. R., Kirkland, A. I. & Saxton, W. O. 2001 A new method for the determination of the coefficients of the wave aberration function. In Electron Microscopy and Analysis 2001, Inst. Phys. Conf. Ser., Dundee, Scotland, 5-7 September 2001, vol. 168, pp. 23-24. Bristol, UK: Institute of Physics Publishing.
20. Meyer, R. R., Kirkland, A. I. & Saxton, W.O. 2002 A new method for the determination of the wave aberration function for high resolution TEM: 1. Measurement of the symmetric aberrations. Ultramicroscopy 92, 89-109. (doi:10.1016/S0304-3991(02)00071-2)
21. Meyer, R. R., Kirkland, A. I. & Saxton, W.O. 2004 A new method for the determination of the wave aberration function for high-resolution TEM: 2. Measurement of the antisymmetric aberrations. Ultramicroscopy 99, 115-123. (doi:10.1016/j.ultramic.2003.11.001)
22. Michelson, A. A. 1890 On the application of interference methods to astronomical measurements. Phil. Mag. 30, 1-21.
23. Pease, F. G. 1931 Interferometer methods in astronomy. Ergeb. Exakt. Naturwiss. 10, 84-96.
24. Rose, H. 2002 Correction of aberrations-past, present and future. Microsc. Microanal. 8(Suppl. 2), 6-7.
25. Ryle, M. & Vonberg D. 1946 Solar radiation on 175mc/s-observations from the first multi-element astronomical radio interferometer. Nat. Mat. 158, 339.
26. Saxton, W. O. 1988 Accurate atom positions from focal and tilted beam series of high-resolution electron-micrographs. Scanning Microsc. 2, 213-224.
27. Smith, D. J., Saxton, W. O., O'Keefe, M. A., Wood, G. J. & Stobbs, W. M. 1983 The importance of beam alignment and crystal tilt in high-resolution electron-microscopy. Ultramicroscopy 11, 263-281. (doi:10.1016/0304-3991(83) 90006-2)
28. Spence, J. C. H. 2002 Experimental high resolution electron microscopy, 3rd edn. Oxford, UK: Oxford University Press.
29. Thust, A., Overwijk, M. H. F., Coene, W. M. J. & Lentzen, M. 1996 Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy 64, 249-264. (doi:10.1016/0304-3991(96)00022-8)
30. Tillmann, K., Thust, A. & Urban, K. 2004 Spherical aberration correction in tandem with exit-plane wave function reconstruction: interlocking tools for the atomic scale imaging of lattice defects in GaAs. Microsc. Microanal. 10, 185-198. (doi:10.1017/S143192760404039)
31. Tsuno, K., Kaneyama, T., Honda, T., Tsuda, K., Terauchi, M. & Tanaka, M. 1997 Design and testing of omega mode imaging energy filters at 200 kV J. Electron Microsc. 46, 357-368.
32. Typke, D. & Dierksen, K. 1995 Determination of image aberrations in high-resolution electron-microscopy using diffractogram and cross-correlation methods. Optik 99, 155.
33. Uhlemann, S. & Haider, M. 1998 Residual wave aberrations in the first spherical aberration corrected transmission electron microscope. Ultramicroscopy 72, 109-119. (doi:10.1016/S0304-3991(97)00102-2)
34. Wiener, N. 1949 Extrapolation, interpolation, and smoothing of stationary time series. New York, NY: Wiley.
35. Zemlin, J. & Zemlin, F. 2002 Diffractogram tableaux by mouse click. Ultramicroscopy 93, 77-82. (doi:10.1016/S0304-3991(02)00148-1)
36. Zemlin, F., Weiss, K., Schiske, P., Kunath, W. & Herrmann, K. H. 1978 Coma-free alignment of high resolution electron microscopes with the aid of optical diffractograms. Ultramicroscopy 3, 49-60. (doi:10.1016/S0304-3991(78) 80006-0)