Recent progress in neural probes using silicon MEMS technology

IEEJ Transactions on Electrical and Electronic Engineering

Volumn 5, Issue 5, 2010, Pages 505-515

  Ruther, Patrick ^a   Herwik, Stanislav ^a   Kisban, Sebastian ^a   Seidl, Karsten ^a   Paul, Oliver ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

Author keywords

Electronic depth control; Multielectrode arrays; Neural recording; Post CMOS micromachining

Indexed keywords

EID: 77956912865     PISSN: 19314973     EISSN: 19314981     Source Type: Journal    
DOI: 10.1002/tee.20566     Document Type: Article

References (49)

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