Interpreting transistor noise

IEEE Microwave Magazine

Volumn 11, Issue 6, 2010, Pages 61-69

  Pospieszalski, Marian W ^a  

^a NATIONAL RADIO ASTRONOMY OBSERVATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT DESIGNERS; ENGINEERING PRACTICES; FIELD EFFECTS; MEASURED DATA; NOISE MODELS; NOISE PARAMETERS; TRANSISTOR NOISE;

BIPOLAR TRANSISTORS; MODELS;

FIELD EFFECT TRANSISTORS;

EID: 77956571573     PISSN: 15273342     EISSN: None     Source Type: Trade Journal    
DOI: 10.1109/MMM.2010.937733     Document Type: Conference Paper

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