Noise performance scaling in high-speed silicon RF technologies

2003 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Digest of Papers

Volumn , Issue , 2003, Pages 22-25

  Greenberg, D R ^b   Sweeney, S ^a   Jagannathan, B ^a   Freeman, G ^a   Ahlgren, D ^a  

^a IBM MICROELECTRONICS   (United States)

^b IBM RESEARCH   (United States)

Author keywords

Germanium silicon alloys; Heterojunction bipolar transistors; Integrated circuit noise; Low frequency noise; Microelectronics; Noise figure; Noise generators; Radio frequency; Silicon germanium; Wireless LAN

Indexed keywords

BALLOONS; BICMOS TECHNOLOGY; DROPS; GERMANIUM; GERMANIUM ALLOYS; HETEROJUNCTION BIPOLAR TRANSISTORS; HETEROJUNCTIONS; INTEGRATED CIRCUITS; MICROELECTRONICS; NOISE FIGURE; NOISE GENERATORS; SILICON; SILICON ALLOYS; THERMAL NOISE; WIRELESS LOCAL AREA NETWORKS (WLAN); WIRELESS TELECOMMUNICATION SYSTEMS;

GERMANIUM SILICON ALLOY; INTEGRATED CIRCUIT NOISE; LOW-FREQUENCY NOISE; RADIO FREQUENCIES; SILICON GERMANIUM;

MONOLITHIC INTEGRATED CIRCUITS;

EID: 24944592650     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SMIC.2003.1196659     Document Type: Conference Paper

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