Efficient photoluminescence from pulsed laser ablated nanostructured indium oxide films

Materials Science and Engineering: B

Volumn 174, Issue 1-3, 2010, Pages 59-65

  Beena, D ^a   Vinodkumar, R ^a   Navas, I ^a   Rajan, Geo ^a   Mahadevan Pillai, V P ^a  

^a UNIVERSITY OF KERALA   (India)

Author keywords

Atomic force microscopy; Indium oxide films; Nanocrystalline materials; Photoluminescence; Pulsed laser ablation; Quantum dots; X ray diffraction analysis

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; ENERGY GAP; INDIUM COMPOUNDS; LASER ABLATION; LATTICE CONSTANTS; NANOCRYSTALS; OPTICAL PROPERTIES; OXIDE FILMS; PARTICLE SIZE; PARTICLE SIZE ANALYSIS; PHOTOLUMINESCENCE; PULSED LASERS; QUANTUM CONFINEMENT; QUANTUM DOT LASERS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS; SINTERING; THIN FILMS;

ANNEALING TEMPERATURES; ATOMIC-FORCE-MICROSCOPY; ELECTRICAL MEASUREMENT; INDIUM OXIDE FILMS; LASER ABLATION TECHNIQUE; NANO-STRUCTURED; NANOCRYSTALLINE INDIUM OXIDE; PULSED LASER ABLATION; QUANTUM CONFINEMENT EFFECTS; QUANTUM DOT;

X RAY DIFFRACTION ANALYSIS;

EID: 77956461787     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2010.03.005     Document Type: Conference Paper

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