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Volumn 112, Issue , 1997, Pages 231-235

Modifying ALE grown In 2 O 3 films by benzoyl fluoride pulses

Author keywords

Atomic layer epitaxy; Benzoyl fluoride; Indium oxide

Indexed keywords

CARRIER CONCENTRATION; CHARGE CARRIERS; ELECTRIC CONDUCTIVITY; EPITAXIAL GROWTH; FILM GROWTH; FLUORINE COMPOUNDS; OXIDES; SEMICONDUCTING INDIUM COMPOUNDS; SURFACE STRUCTURE; THIN FILMS; TRANSPARENCY;

EID: 0031546858     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00986-5     Document Type: Article
Times cited : (26)

References (26)
  • 20
    • 0008851063 scopus 로고
    • Nuclear reaction analysis: Particle-gamma reactions
    • eds. J.R. Tesmer and M. Nastasi Materials Research Society
    • J.-P. Hirvonen, and R. Lappalainen, Nuclear reaction analysis: Particle-gamma reactions in: Handbook of Modern Ion Beam Material Analysis, eds. J.R. Tesmer and M. Nastasi (Materials Research Society, 1995) pp. 167-192; 573-613.
    • (1995) Handbook of Modern Ion Beam Material Analysis , pp. 167-192
    • Hirvonen, J.-P.1    Lappalainen, R.2
  • 22
    • 0004071199 scopus 로고    scopus 로고
    • Card 6-416, JCPDS International Center for Diffraction Data, Swarthmore, USA
    • Joint Commitee on Powder Diffraction Standards, Card 6-416, JCPDS International Center for Diffraction Data, Swarthmore, USA.
    • Joint Commitee on Powder Diffraction Standards


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.