Thermal conductivity of pure silica MEL and MFI zeolite thin films

Journal of Applied Physics

Volumn 108, Issue 4, 2010, Pages

  Coquil, Thomas ^a   Lew, Christopher M ^b   Yan, Yushan ^b   Pilon, Laurent ^a  

^a Engineering IV   (United States)

^b University of California Riverside   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

1-BUTANOL; CRYSTALLIZATION TIME; DIELECTRIC CONSTANTS; HIGHLY POROUS SILICA; IN-SITU CRYSTALLIZATION; MASS FRACTION; MESOPOROUS SILICA THIN FILMS; MFI ZEOLITE; NANOPARTICLE SIZES; NONUNIFORM; PURE SILICA; PURE SILICA ZEOLITES; RELATIVE CRYSTALLINITY; ROOM TEMPERATURE; SILICON SUBSTRATES; SILYLATIONS; TRIMETHYLCHLOROSILANES; VAPOR PHASE;

AMORPHOUS FILMS; CALCINATION; CRYSTALLINE MATERIALS; CRYSTALLIZATION; GELS; NANOPARTICLES; POROSITY; SILICA; THERMAL CONDUCTIVITY; THERMOANALYSIS; THIN FILMS; VAPOR DEPOSITION;

THERMAL CONDUCTIVITY OF SOLIDS;

EID: 77956312763     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3462500     Document Type: Conference Paper

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