-
2
-
-
33845439609
-
-
Zehnder AT, Sengupta D, Hines MA (2006) Methyl monolayers improve the fracture strength and durability of silicon nanobeams. Applied Physics Letters 89: 231905.
-
-
-
-
3
-
-
0038382884
-
The mechanical strength of polysilicon films: Part 2. Size effects associated with elliptical and circular perforations
-
Chasiotis I, Knauss WG (2003) The mechanical strength of polysilicon films: Part 2. Size effects associated with elliptical and circular perforations. Journal of the Mechanics and Physics of Solids 51: 1551-1572.
-
(2003)
Journal of the Mechanics and Physics of Solids
, vol.51
, pp. 1551-1572
-
-
Chasiotis, I.1
Knauss, W.G.2
-
4
-
-
1942468578
-
Mechanical characterization of polysilicon through on-chip tensile tests
-
Corigliano A, De Masi B, Frangi A, Comi C, Villa A, Marchi M (2004) Mechanical characterization of polysilicon through on-chip tensile tests. Journal of Microelectromechanical Systems 13: 200-219.
-
(2004)
Journal of Microelectromechanical Systems
, vol.13
, pp. 200-219
-
-
Corigliano, A.1
de Masi, B.2
Frangi, A.3
Comi, C.4
Villa, A.5
Marchi, M.6
-
5
-
-
33749576836
-
Relation between stochastic failure location and strength in brittle materials
-
Givli S, Altus E (2006) Relation between stochastic failure location and strength in brittle materials. Journal of Applied Mechanics-Transactions of the ASME 73: 698-701.
-
(2006)
Journal of Applied Mechanics-Transactions of the ASME
, vol.73
, pp. 698-701
-
-
Givli, S.1
Altus, E.2
-
6
-
-
34347217473
-
Characteristics of a commercially available silicon-on-insulator MEMS material
-
Miller DC, Boyce BL, Dugger MT, Buchheit TE, Gall K (2007) Characteristics of a commercially available silicon-on-insulator MEMS material. Sensors & Actuators: A Physical 138: 130-144.
-
(2007)
Sensors & Actuators: A Physical
, vol.138
, pp. 130-144
-
-
Miller, D.C.1
Boyce, B.L.2
Dugger, M.T.3
Buchheit, T.E.4
Gall, K.5
-
7
-
-
33846383743
-
Fabrication and probabilistic fracture strength prediction of high-aspect-ratio single crystal silicon carbide microspecimens with stress concentration
-
Nemeth NN, Evans LJ, Jadaan OM, Sharpe WN, Beheim GM, Trapp MA (2007) Fabrication and probabilistic fracture strength prediction of high-aspect-ratio single crystal silicon carbide microspecimens with stress concentration. Thin Solid Films 515: 3283-3290.
-
(2007)
Thin Solid Films
, vol.515
, pp. 3283-3290
-
-
Nemeth, N.N.1
Evans, L.J.2
Jadaan, O.M.3
Sharpe, W.N.4
Beheim, G.M.5
Trapp, M.A.6
-
9
-
-
24144436225
-
Out of plane vs. in plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach
-
Cacchione F, Corigliano A, De Masi B, Riva C (2005) Out of plane vs. in plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach. Microelectronics and Reliability 45: 1758-1763.
-
(2005)
Microelectronics and Reliability
, vol.45
, pp. 1758-1763
-
-
Cacchione, F.1
Corigliano, A.2
de Masi, B.3
Riva, C.4
-
10
-
-
25144487735
-
Friction and fracture properties of polysilicon coated with self-assembled monolayers
-
Ding JN, Wong PL, Yang JC (2006) Friction and fracture properties of polysilicon coated with self-assembled monolayers. Wear 260: 209-214.
-
(2006)
Wear
, vol.260
, pp. 209-214
-
-
Ding, J.N.1
Wong, P.L.2
Yang, J.C.3
-
12
-
-
0031553481
-
In situ tensile strength measurement and Weibull analysis of thick film and thin film micromachined polysilicon structures
-
Greek S, Ericson F, Johansson S, Schweitz JA (1997) In situ tensile strength measurement and Weibull analysis of thick film and thin film micromachined polysilicon structures. Thin Solid Films 292: 247-254.
-
(1997)
Thin Solid Films
, vol.292
, pp. 247-254
-
-
Greek, S.1
Ericson, F.2
Johansson, S.3
Schweitz, J.A.4
-
14
-
-
0038397338
-
Vapor deposition of amino-functionalized self-assembled monolayers on MEMS
-
Hankins MG, Resnick PJ, Clews PJ, Mayer TM, Wheeler DR, Tanner DM et al (2003) Vapor deposition of amino-functionalized self-assembled monolayers on MEMS. Reliability, Testing, and Characterization of Mems/Moems Ii 4980: 238-247.
-
(2003)
Reliability, Testing, and Characterization of Mems/Moems Ii
, vol.4980
, pp. 238-247
-
-
Hankins, M.G.1
Resnick, P.J.2
Clews, P.J.3
Mayer, T.M.4
Wheeler, D.R.5
Tanner, D.M.6
-
15
-
-
0033749085
-
Fracture toughness of polysilicon MEMS devices
-
Kahn H, Tayebi N, Ballarini R, Mullen RL, Heuer AH (2000) Fracture toughness of polysilicon MEMS devices. Sensors and Actuators. A, Physical 82: 274-280.
-
(2000)
Sensors and Actuators. A, Physical
, vol.82
, pp. 274-280
-
-
Kahn, H.1
Tayebi, N.2
Ballarini, R.3
Mullen, R.L.4
Heuer, A.H.5
|