Relation between stochastic failure location and strength in brittle materials

Journal of Applied Mechanics, Transactions ASME

Volumn 73, Issue 4, 2006, Pages 698-701

  Givli, Sefi ^a   Altus, Eli ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ARBITRARY DISTRIBUTED LOADS; STOCHASTIC FAILURE LOCATION; STRENGTH DISTRIBUTIONS; STRESS FIELD EFFECTS;

BENDING (DEFORMATION); BRITTLENESS; FAILURE (MECHANICAL); RANDOM PROCESSES; STRENGTH OF MATERIALS; STRUCTURAL LOADS;

STATISTICAL METHODS;

EID: 33749576836     PISSN: 00218936     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.2150501     Document Type: Article

References (14)

1. Ashby, M. F., and Jones, D. E. H., 1986, Engineering Materials 2, Pergamon. New York.
2. Davidge, R. W., 1979, Mechanical Behavior of Ceramics, Cambridge University Press, Cambridge, UK.
3. Greek, S., Ericson, F., Johansson, S., Furtsch, M., and Rump, A., 1999, "Me-chanical Characterization of Thick Polysilicon Films: Young's Modulus and Fracture Strength Evaluated with Microstructures," J. Micromech. Microeng., 9, pp. 245-151.
4. Jones, P. T., Johnson, G. C., and Howe, R. T., 1999, "Statistical Characterization of Fracture of Brittle MEMS Materials," Proceedings MEMS Reliability for Critical and Space Applications, Soc. Of Photo-Optical Instr. Eng., Bellingham WA. pp. 20-29.
5. Sharpe, W. N., Yuan, B., Vaidynathan, R., and Edwards, R., 1997, "Measurements of Young Modulus, Poisson Ratio and Tensile Strength of Polysilicon," Proceedings of the 10th IEEE International Workshop on Microelectrome-chanical Systems, IEEE. Piscataway, NJ. pp. 424-429.
6. Elbrecht, L., and Binder, J., 1999. "The Mechanical Properties of Thin Polycrystalline Silicon Films as Function of Deposition and Doping Conditions," Sens. Mater., 11(3), pp. 163-179.
7. Namazu, T., Isono, Y., and Tanaka, T., 2000, "Evaluation of Size Effect on Mechanical Properties of Single Crystal Silicon by Nanoscale Bending Test Using AFM," J. Micromechanical Syst., 9(4), pp. 450-459.
8. Altus, E., and Givli, S., 2003, "Strength Reliability of Statistical Heterogeneous Microbeams," Int. J. Solids Struct., 40(9), pp. 2069-2083.
9. Givli, S., and Altus, E., 2003, "Effect of Modulus-Strength Correlation on the Reliability of Randomly Heterogeneous Beams," Int. J. Solids Struct., 40(24), pp. 6703-6722.
10. Ostoja-Starzewski, M., 2004, "Fracture of Brittle Microbeams," J. Appl. Mech., 71, pp. 424-427.
11. Elata, D., and Hirshberg, A., 2005, "A Novel Test Device for Measuring the Strength of Microbeams," J. Microelectromech. Syst., (to be published).
12. Weibull, W., 1951, "A Statistical Distribution Function of Wide Applicability," J. Appl. Mech., 18(3), pp. 293-297.
13. Ballarini. R., Mullen, R. L., and Heuer, A. H., 1999, "The Effects of Heterogeneity and Anisotropy on the Size Effect in Cracked Polycrystalline Films," Int. J. Fract., 95, pp. 19-39.
14. Abernethy, R. B., 2000, The New Weibull Handbook, SAE International, North Palm Beach, FL.