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Scripta Materialia

Volumn 63, Issue 2, 2010, Pages 192-195

Microstructural investigation of Ti-Si-N hard coatings

(6) Tang, Fengzai a Gault, Baptiste b Ringer, Simon P a Martin, Phil c Bendavid, Avi c Cairney, Julie M a

a UNIVERSITY OF SYDNEY (Australia)

b UNIVERSITY OF OXFORD (United Kingdom)

c CSIRO (Australia)

Author keywords

Nanocomposite; Nanostructure; Pulsed laser atom probe (PLAP); Titanium silicon nitride

Indexed keywords

ATOM PROBE; MICROSTRUCTURAL INVESTIGATION; NANOSTRUCTURED TI; PULSED LASER; TI-SI-N; TITANIUM SILICON NITRIDE;

ATOMS; GRAIN BOUNDARIES; NANOCOMPOSITES; NANOSTRUCTURES; PROBES; PULSED LASER APPLICATIONS; PULSED LASERS; SILICON; SILICON NITRIDE; TITANIUM; TITANIUM NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

HARD COATINGS;

EID: 77955869117 PISSN: 13596462 EISSN: None Source Type: Journal
DOI: 10.1016/j.scriptamat.2010.03.050 Document Type: Article

Times cited : (31)

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