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Volumn 479, Issue 1-2, 2005, Pages 193-200

Deformation and fracture of Ti-Si-N nanocomposite films

Author keywords

Focused ion beam (FIB); Nanostructures; Titanium nitride (TIN); Transmission electron microscopy (TEM)

Indexed keywords

CRYSTAL MICROSTRUCTURE; DEFORMATION; FRACTURE; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; INORGANIC COATINGS; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; THERMODYNAMIC STABILITY; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; WEAR RESISTANCE; X RAY DIFFRACTION ANALYSIS;

EID: 15344342887     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.11.185     Document Type: Article
Times cited : (37)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.