EPR study of carbon and silicon related defects in carbon-rich hydrogenated amorphous silicon-carbon films

Physical Review B - Condensed Matter and Materials Physics

Volumn 81, Issue 15, 2010, Pages

  Kalabukhova, E N ^a   Lukin, S N ^a   Savchenko, D V ^a   Shanina, B D ^a   Vasin, A V ^a   Lysenko, V S ^a   Nazarov, A N ^a   Rusavsky, A V ^a   Hoentsch, J ^b   Koshka, Y ^c  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^b UNIVERSITY OF LEIPZIG   (Germany)

^c MISSISSIPPI STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77955374514     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.81.155319     Document Type: Article

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