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Volumn 352, Issue 1-2, 1999, Pages 249-258

Properties of a-Si1-x Cx:H thin films deposited from the organosilane Triethylsilane

Author keywords

Absorption; Amorphous silicon carbon alloys; Fourier transform infrared spectroscopy; Photoluminescence; Refractive index

Indexed keywords


EID: 0000704698     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00320-X     Document Type: Article
Times cited : (19)

References (31)
  • 2
    • 0347254518 scopus 로고    scopus 로고
    • A.M. Wrobel, M.R. Wertheimer, d' Agostino (1990)
    • A.M. Wrobel, M.R. Wertheimer, d' Agostino (1990).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.