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Volumn 157, Issue 8, 2010, Pages

Bipolar switching characteristics and scalability in NiO layers made by thermal oxidation of Ni

(9) Goux, L a Polspoel, W a Lisoni, J G a Chen, Y Y a,b Pantisano, L a Wang, X P a Vandervorst, W a Jurczak, M a Wouters, D J a,b

a IMEC (Belgium)

b Katholieke Universiteit Leuven (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ANIONIC SPECIES; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CONDUCTIVE CHANNELS; ELECTRICAL MEASUREMENT; ELECTROCHEMICAL REDOX; MACROSCOPIC SCALE; NANO-METER SCALE; PHYSICAL CHARACTERIZATION; SWITCHING CHARACTERISTICS; SWITCHING PROPERTIES; THERMAL OXIDATION;

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; OXIDATION; OXYGEN; REDOX REACTIONS; SWITCHING;

OXYGEN VACANCIES;

EID: 77954724103 PISSN: 00134651 EISSN: None Source Type: Journal
DOI: 10.1149/1.3454199 Document Type: Article

Times cited : (13)

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