SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 107, Issue 12, 2010, Pages

In situ reflection anisotropy spectroscopy analysis of heteroepitaxial GaP films grown on Si(100)

(2) Döscher, Henning a Hannappel, Thomas a

a HAHN MEITNER INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIPHASE; ANTIPHASE DOMAINS; ATOMIC ORDERS; DIFFERENCE SPECTROSCOPY; HETERO INTERFACES; HETEROEPITAXIAL; HETEROEPITAXIAL FILMS; HOMOEPITAXIAL; IN-SITU; LINEAR REDUCTION; PHOTON ENERGY; SI(1 0 0); SPECTRAL POSITION; SPECTROSCOPIC SIGNATURES;

ANISOTROPY; GALLIUM ALLOYS; PHOSPHORUS; PROBES; REFLECTION; SURFACE RECONSTRUCTION;

ATOMIC SPECTROSCOPY;

EID: 77954191145 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3357391 Document Type: Article

Times cited : (75)

References (41)

1
- 0031359695
- PCGMED 0960-8974. 10.1016/S0960-8974(97)00024-7
- J. T. Zettler, Prog. Cryst. Growth Charact. Mater. PCGMED 0960-8974 35, 27 (1997). 10.1016/S0960-8974(97)00024-7
- (1997) Prog. Cryst. Growth Charact. Mater. , vol.35 , pp. 27
- Zettler, J.T.¹

2
- 84954560422
- JVTAD6 0734-2101. 10.1116/1.575694
- D. E. Aspnes, J. P. Harbison, A. A. Studna, and L. T. Florez, J. Vac. Sci. Technol. A JVTAD6 0734-2101 6, 1327 (1988). 10.1116/1.575694
- (1988) J. Vac. Sci. Technol. A , vol.6 , pp. 1327
- Aspnes, D.E.¹ Harbison, J.P.² Studna, A.A.³ Florez, L.T.⁴

3
- 55149087730
- APPLAB 0003-6951. 10.1063/1.3009570
- H. Döscher, T. Hannappel, B. Kunert, A. Beyer, K. Volz, and W. Stolz, Appl. Phys. Lett. APPLAB 0003-6951 93, 172110 (2008). 10.1063/1.3009570
- (2008) Appl. Phys. Lett. , vol.93 , pp. 172110
- Döscher, H.¹ Hannappel, T.² Kunert, B.³ Beyer, A.⁴ Volz, K.⁵ Stolz, W.⁶

4
- 0000965540
- PRLTAO 0031-9007. 10.1103/PhysRevLett.82.1879
- L. Li, B. K. Han, Q. Fu, and R. F. Hicks, Phys. Rev. Lett. PRLTAO 0031-9007 82, 1879 (1999). 10.1103/PhysRevLett.82.1879
- (1999) Phys. Rev. Lett. , vol.82 , pp. 1879
- Li, L.¹ Han, B.K.² Fu, Q.³ Hicks, R.F.⁴

5
- 0343290203
- UPS and 20 K reflectance anisotropy spectroscopy of the P-rich and In-rich surfaces of InP(1 0 0)
- DOI 10.1016/S0039-6028(00)00936-5
- T. Hannappel, L. Toben, S. Visbeck, H. J. Crawack, C. Pettenkofer, and F. Willig, Surf. Sci. SUSCAS 0039-6028 470, L1 (2000). 10.1016/S0039-6028(00) 00936-5 (Pubitemid 32077271)
- (2000) Surface Science , vol.470 , Issue.1-2
- Hannappel, T.¹ Toben, L.² Visbeck, S.³ Crawack, H.-J.⁴ Pettenkofer, C.⁵ Willig, F.⁶

6
- 0035841378
- RDS, LEED and STM of the P-rich and Ga-rich surfaces of GaP(100)
- DOI 10.1016/S0039-6028(01)01492-3, PII S0039602801014923
- L. Töben, T. Hannappel, K. Moller, H. J. Crawack, C. Pettenkofer, and F. Willig, Surf. Sci. SUSCAS 0039-6028 494, L755 (2001). 10.1016/S0039-6028(01)01492-3 (Pubitemid 33039248)
- (2001) Surface Science , vol.494 , Issue.1
- Toben, L.¹ Hannappel, T.² Moller, K.³ Crawack, H.-J.⁴ Pettenkofer, C.⁵ Willig, F.⁶

7
- 0001429795
- PRBMDO 0163-1829. 10.1103/PhysRevB.60.R5117
- P. Vogt, T. Hannappel, S. Visbeck, K. Knorr, N. Esser, and W. Richter, Phys. Rev. B PRBMDO 0163-1829 60, R5117 (1999). 10.1103/PhysRevB.60.R5117
- (1999) Phys. Rev. B , vol.60 , pp. 5117
- Vogt, P.¹ Hannappel, T.² Visbeck, S.³ Knorr, K.⁴ Esser, N.⁵ Richter, W.⁶

8
- 24644483772
- JVTBD9 1071-1023. 10.1116/1.590810
- N. Esser, W. G. Schmidt, J. Bernholc, A. M. Frisch, P. Vogt, M. Zorn, M. Pristovsek, W. Richter, F. Bechstedt, T. Hannappel, and S. Visbeck, J. Vac. Sci. Technol. B JVTBD9 1071-1023 17, 1691 (1999). 10.1116/1.590810
- (1999) J. Vac. Sci. Technol. B , vol.17 , pp. 1691
- Esser, N.¹ Schmidt, W.G.² Bernholc, J.³ Frisch, A.M.⁴ Vogt, P.⁵ Zorn, M.⁶ Pristovsek, M.⁷ Richter, W.⁸ Bechstedt, F.⁹ Hannappel, T.¹⁰ Visbeck, S.¹¹

9
- 0032115436
- SUSCAS 0039-6028. 10.1016/S0039-6028(98)00260-X
- W. G. Schmidt and F. Bechstedt, Surf. Sci. SUSCAS 0039-6028 409, 474 (1998). 10.1016/S0039-6028(98)00260-X
- (1998) Surf. Sci. , vol.409 , pp. 474
- Schmidt, W.G.¹ Bechstedt, F.²

10
- 0034895004
- PRBMDO 0163-1829. 10.1103/PhysRevB.63.245303
- S. Visbeck, T. Hannappel, M. Zorn, J. T. Zettler, and F. Willig, Phys. Rev. B PRBMDO 0163-1829 63, 245303 (2001). 10.1103/PhysRevB.63.245303
- (2001) Phys. Rev. B , vol.63 , pp. 245303
- Visbeck, S.¹ Hannappel, T.² Zorn, M.³ Zettler, J.T.⁴ Willig, F.⁵

11
- 0042847302
- (World Scientific, Singapore)
- P. H. Hahn and W. G. Schmidt, Surface Ordering of P-rich InP(001): Hydrogen Stabilization vs Electron Correlation (World Scientific, Singapore, 2002), pp. 163-167.
- (2002) Surface Ordering of P-rich InP(001): Hydrogen Stabilization Vs Electron Correlation , pp. 163-167
- Hahn, P.H.¹ Schmidt, W.G.²

12
- 0035517114
- JECMA5 0361-5235. 10.1007/s11664-001-0196-7
- T. Hannappel, L. Toben, K. Moller, and F. Willig, J. Electron. Mater. JECMA5 0361-5235 30, 1425 (2001). 10.1007/s11664-001-0196-7
- (2001) J. Electron. Mater. , vol.30 , pp. 1425
- Hannappel, T.¹ Toben, L.² Moller, K.³ Willig, F.⁴

13
- 21344468143
- Reflection anisotropy spectroscopy
- DOI 10.1088/0034-4885/68/6/R01, PII S003448850508200X
- P. Weightman, D. S. Martin, R. J. Cole, and T. Farrell, Rep. Prog. Phys. RPPHAG 0034-4885 68, 1251 (2005). 10.1088/0034-4885/68/6/R01 (Pubitemid 40906220)
- (2005) Reports on Progress in Physics , vol.68 , Issue.6 , pp. 1251-1341
- Weightman, P.¹ Martin, D.S.² Cole, R.J.³ Farrell, T.⁴

14
- 0346308579
- JCRGAE 0022-0248. 10.1016/j.jcrysgro.2003.11.019
- Z. Kollonitsch, K. Moller, H. J. Schimper, C. Giesen, M. Heuken, F. Willig, and T. Hannappel, J. Cryst. Growth JCRGAE 0022-0248 261, 289 (2004). 10.1016/j.jcrysgro.2003.11.019
- (2004) J. Cryst. Growth , vol.261 , pp. 289
- Kollonitsch, Z.¹ Moller, K.² Schimper, H.J.³ Giesen, C.⁴ Heuken, M.⁵ Willig, F.⁶ Hannappel, T.⁷

15
- 9944246012
- THSFAP 0040-6090. 10.1016/j.tsf.2004.06.150
- O. Hunderi, J. T. Zettler, and K. Haberland, Thin Solid Films THSFAP 0040-6090 472, 261 (2005). 10.1016/j.tsf.2004.06.150
- (2005) Thin Solid Films , vol.472 , pp. 261
- Hunderi, O.¹ Zettler, J.T.² Haberland, K.³

16
- 0039583734
- PRBMDO 0163-1829. 10.1103/PhysRevB.51.7603
- J. S. Luo, J. M. Olson, S. R. Kurtz, D. J. Arent, K. A. Bertness, M. E. Raikh, and E. V. Tsiper, Phys. Rev. B PRBMDO 0163-1829 51, 7603 (1995). 10.1103/PhysRevB.51.7603
- (1995) Phys. Rev. B , vol.51 , pp. 7603
- Luo, J.S.¹ Olson, J.M.² Kurtz, S.R.³ Arent, D.J.⁴ Bertness, K.A.⁵ Raikh, M.E.⁶ Tsiper, E.V.⁷

17
- 0000328366
- JAPIAU 0021-8979. 10.1063/1.346316
- O. Acher, S. M. Koch, F. Omnes, M. Defour, M. Razeghi, and B. Drevillon, J. Appl. Phys. JAPIAU 0021-8979 68, 3564 (1990). 10.1063/1.346316
- (1990) J. Appl. Phys. , vol.68 , pp. 3564
- Acher, O.¹ Koch, S.M.² Omnes, F.³ Defour, M.⁴ Razeghi, M.⁵ Drevillon, B.⁶

18
- 0037292381
- JCRGAE 0022-0248. 10.1016/S0022-0248(02)01928-0
- K. Moller, Z. Kollonitsch, C. Giesen, M. Heuken, F. Willig, and T. Hannappel, J. Cryst. Growth JCRGAE 0022-0248 248, 244 (2003). 10.1016/S0022-0248(02)01928-0
- (2003) J. Cryst. Growth , vol.248 , pp. 244
- Moller, K.¹ Kollonitsch, Z.² Giesen, C.³ Heuken, M.⁴ Willig, F.⁵ Hannappel, T.⁶

19
- 0032119472
- JAPNDE 0021-4922. 10.1143/JJAP.37.4109
- M. Murayama, K. Shiraishi, and T. Nakayama, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 37, 4109 (1998). 10.1143/JJAP.37.4109
- (1998) Jpn. J. Appl. Phys., Part 1 , vol.37 , pp. 4109
- Murayama, M.¹ Shiraishi, K.² Nakayama, T.³

20
- 4244137953
- PRBMDO 0163-1829. 10.1103/PhysRevB.61.R16335
- W. G. Schmidt, N. Esser, A. M. Frisch, P. Vogt, J. Bernholc, F. Bechstedt, M. Zorn, T. Hannappel, S. Visbeck, F. Willig, and W. Richter, Phys. Rev. B PRBMDO 0163-1829 61, R16335 (2000). 10.1103/PhysRevB.61.R16335
- (2000) Phys. Rev. B , vol.61 , pp. 16335
- Schmidt, W.G.¹ Esser, N.² Frisch, A.M.³ Vogt, P.⁴ Bernholc, J.⁵ Bechstedt, F.⁶ Zorn, M.⁷ Hannappel, T.⁸ Visbeck, S.⁹ Willig, F.¹⁰ Richter, W.¹¹

21
- 0032594896
- (Wiley, New York)
- F. Bechstedt, O. Pulci, and W. G. Schmidt, Theoretical Aspects of the Optical Response of Semiconductor Surfaces (Wiley, New York, 1999), pp. 5-16.
- (1999) Theoretical Aspects of the Optical Response of Semiconductor Surfaces , pp. 5-16
- Bechstedt, F.¹ Pulci, O.² Schmidt, W.G.³

22
- 0034832570
- First-principles study of InP and GaP(0 0 1) surfaces
- DOI 10.1016/S0927-0256(01)00161-6, PII S0927025601001616
- O. Pulci, K. Ludge, P. Vogt, N. Esser, W. G. Schmidt, W. Richter, and F. Bechstedt, Comput. Mater. Sci. CMMSEM 0927-0256 22, 32 (2001). 10.1016/S0927-0256(01)00161-6 (Pubitemid 32867109)
- (2001) Computational Materials Science , vol.22 , Issue.1-2 , pp. 32-37
- Pulci, O.¹ Ludge, K.² Vogt, P.³ Esser, N.⁴ Schmidt, W.G.⁵ Richter, W.⁶ Bechstedt, F.⁷

23
- 5744228924
- PRBMDO 0163-1829. 10.1103/PhysRevB.68.033311
- P. H. Hahn, W. G. Schmidt, F. Bechstedt, O. Pulci, and R. Del Sole, Phys. Rev. B PRBMDO 0163-1829 68, 033311 (2003). 10.1103/PhysRevB.68.033311
- (2003) Phys. Rev. B , vol.68 , pp. 033311
- Hahn, P.H.¹ Schmidt, W.G.² Bechstedt, F.³ Pulci, O.⁴ Del Sole, R.⁵

24
- 0001323247
- PRBMDO 0163-1829. 10.1103/PhysRevB.60.2488
- A. M. Frisch, W. G. Schmidt, J. Bernholc, M. Pristovsek, N. Esser, and W. Richter, Phys. Rev. B PRBMDO 0163-1829 60, 2488 (1999). 10.1103/PhysRevB.60. 2488
- (1999) Phys. Rev. B , vol.60 , pp. 2488
- Frisch, A.M.¹ Schmidt, W.G.² Bernholc, J.³ Pristovsek, M.⁴ Esser, N.⁵ Richter, W.⁶

25
- 0242721061
- JAPIAU 0021-8979. 10.1063/1.1615699
- D. C. Law, Y. Sun, and R. F. Hicks, J. Appl. Phys. JAPIAU 0021-8979 94, 6175 (2003). 10.1063/1.1615699
- (2003) J. Appl. Phys. , vol.94 , pp. 6175
- Law, D.C.¹ Sun, Y.² Hicks, R.F.³

26
- 0003014280
- Reflectance difference spectroscopy of mixed phases of indium phosphide (001)
- DOI 10.1063/1.1337620
- M. J. Begarney, C. H. Li, D. C. Law, S. B. Visbeck, Y. Sun, and R. F. Hicks, Appl. Phys. Lett. APPLAB 0003-6951 78, 55 (2001). 10.1063/1.1337620 (Pubitemid 33661755)
- (2001) Applied Physics Letters , vol.78 , Issue.1 , pp. 55-57
- Begarney, M.J.¹ Li, C.H.² Law, D.C.³ Visbeck, S.B.⁴ Sun, Y.⁵ Hicks, R.F.⁶

27
- 54849431969
- THSFAP 0040-6090. 10.1016/j.tsf.2008.08.077
- B. Kunert, I. Nemeth, S. Reinhard, K. Volz, and W. Stolz, Thin Solid Films THSFAP 0040-6090 517, 140 (2008). 10.1016/j.tsf.2008.08.077
- (2008) Thin Solid Films , vol.517 , pp. 140
- Kunert, B.¹ Nemeth, I.² Reinhard, S.³ Volz, K.⁴ Stolz, W.⁵

28
- 41449091481
- (Elsevier, Amsterdam)
- I. Nemeth, B. Kunert, W. Stolz, and K. Volz, Heteroepitaxy of GaP on Si: Correlation of morphology, anti-phase-domain structure and MOVPE growth conditions (Elsevier, Amsterdam, 2008), pp. 1595-1601.
- (2008) Heteroepitaxy of GaP on Si: Correlation of Morphology, Anti-phase-domain Structure and MOVPE Growth Conditions , pp. 1595-1601
- Nemeth, I.¹ Kunert, B.² Stolz, W.³ Volz, K.⁴

29
- 24544453940
- PRLTAO 0031-9007. 10.1103/PhysRevLett.59.1691
- D. J. Chadi, Phys. Rev. Lett. PRLTAO 0031-9007 59, 1691 (1987). 10.1103/PhysRevLett.59.1691
- (1987) Phys. Rev. Lett. , vol.59 , pp. 1691
- Chadi, D.J.¹

30
- 3042684637
- RSINAK 0034-6748. 10.1063/1.1711148
- T. Hannappel, S. Visbeck, L. Toben, and F. Willig, Rev. Sci. Instrum. RSINAK 0034-6748 75, 1297 (2004). 10.1063/1.1711148
- (2004) Rev. Sci. Instrum. , vol.75 , pp. 1297
- Hannappel, T.¹ Visbeck, S.² Toben, L.³ Willig, F.⁴

31
- 0016128209
- JPAPBE 0022-3727. 10.1088/0022-3727/7/17/317
- C. T. Foxon, B. A. Joyce, R. F. C. Farrow, and R. M. Griffith, J. Phys. D JPAPBE 0022-3727 7, 2422 (1974). 10.1088/0022-3727/7/17/317
- (1974) J. Phys. D , vol.7 , pp. 2422
- Foxon, C.T.¹ Joyce, B.A.² Farrow, R.F.C.³ Griffith, R.M.⁴

32
- 0034504516
- Reflectance anisotropy spectra for the transition from the P-rich to the In-rich surface reconstruction of InP(1 0 0)
- DOI 10.1016/S0022-0248(00)00668-0
- T. Hannappel, S. Visbeck, M. Zorn, J. T. Zettler, and F. Willig, J. Cryst. Growth JCRGAE 0022-0248 221, 124 (2000). 10.1016/S0022-0248(00)00668-0 (Pubitemid 32071989)
- (2000) Journal of Crystal Growth , vol.221 , Issue.1-4 , pp. 124-128
- Hannappel, T.¹ Visbeck, S.² Zorn, M.³ Zettler, J.-T.⁴ Willig, F.⁵

33
- 0027682317
- (Elsevier, New York)
- S. Zollner, M. Garriga, J. Kircher, J. Humlicek, M. Cardona, and G. Neuhold, Temperature Dependence of the Dielectric Function and the Interband Critical-point Parameters of Gap (Elsevier, New York, 1993), pp. 185-188.
- (1993) Temperature Dependence of the Dielectric Function and the Interband Critical-point Parameters of Gap , pp. 185-188
- Zollner, S.¹ Garriga, M.² Kircher, J.³ Humlicek, J.⁴ Cardona, M.⁵ Neuhold, G.⁶

34
- 0000022752
- PRBMDO 0163-1829. 10.1103/PhysRevB.31.2163
- P. Lautenschlager, P. B. Allen, and M. Cardona, Phys. Rev. B PRBMDO 0163-1829 31, 2163 (1985). 10.1103/PhysRevB.31.2163
- (1985) Phys. Rev. B , vol.31 , pp. 2163
- Lautenschlager, P.¹ Allen, P.B.² Cardona, M.³

35
- 0001091051
- JPAPBE 0022-3727. 10.1088/0022-3727/7/17/318
- R. F. C. Farrow, J. Phys. D JPAPBE 0022-3727 7, 2436 (1974). 10.1088/0022-3727/7/17/318
- (1974) J. Phys. D , vol.7 , pp. 2436
- Farrow, R.F.C.¹

36
- 0015658098
- SPSEAX 0038-5700
- L. N. Glurdzhi, A. P. Izergin, Z. N. Kopylova, and A. D. Remenyuk, Sov. Phys. Semicond. SPSEAX 0038-5700 7, 305 (1973).
- (1973) Sov. Phys. Semicond. , vol.7 , pp. 305
- Glurdzhi, L.N.¹ Izergin, A.P.² Kopylova, Z.N.³ Remenyuk, A.D.⁴

37
- 30244495506
- PRBMDO 0163-1829. 10.1103/PhysRevB.40.1426
- S. E. Acosta-Ortiz and A. Lastras-Martínez, Phys. Rev. B PRBMDO 0163-1829 40, 1426 (1989). 10.1103/PhysRevB.40.1426
- (1989) Phys. Rev. B , vol.40 , pp. 1426
- Acosta-Ortiz, S.E.¹ Lastras-Martínez, A.²

38
- 0022669935
- JCRGAE 0022-0248. 10.1016/0022-0248(87)90391-5
- H. Kroemer, J. Cryst. Growth JCRGAE 0022-0248 81, 193 (1987). 10.1016/0022-0248(87)90391-5
- (1987) J. Cryst. Growth , vol.81 , pp. 193
- Kroemer, H.¹

39
- 0000500968
- JAPIAU 0021-8979. 10.1063/1.343580
- S. Adachi, J. Appl. Phys. JAPIAU 0021-8979 66, 6030 (1989). 10.1063/1.343580
- (1989) J. Appl. Phys. , vol.66 , pp. 6030
- Adachi, S.¹

40
- 33847596250
- PRBMDO 0163-1829. 10.1103/PhysRevB.27.985
- D. E. Aspnes and A. A. Studna, Phys. Rev. B PRBMDO 0163-1829 27, 985 (1983). 10.1103/PhysRevB.27.985
- (1983) Phys. Rev. B , vol.27 , pp. 985
- Aspnes, D.E.¹ Studna, A.A.²

41
- 77954200466
- LAYTEC ANALYSR, A simulation and analysis software, LayTec GmbH, Helmholtzstr. 13/14, D-10587 Berlin, Germany
- LAYTEC ANALYSR, A simulation and analysis software, LayTec GmbH, Helmholtzstr. 13/14, D-10587 Berlin, Germany, http://www.laytec.de

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.