UPS and 20 K reflectance anisotropy spectroscopy of the P-rich and In-rich surfaces of InP(1 0 0)

Surface Science

Volumn 470, Issue 1-2, 2000, Pages

  Hannappel, T ^a   Toben L ^a   Visbeck, S ^a   Crawack, H J ^a   Pettenkofer, C ^a   Willig, F ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; BAND STRUCTURE; LOW ENERGY ELECTRON DIFFRACTION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL CORRELATION; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; RELAXATION PROCESSES; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR GROWTH; VACUUM APPLICATIONS;

REFLECTION ANISOTROPY SPECTROSCOPY; ULTRAHIGH VACUUM (UHV);

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0343290203     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00936-5     Document Type: Article

References (16)

1. Sudo S., Nakano Y., Sugiyama M., Shimogaki Y., Komiyama H., Tada K. Thin Solid Films. 313-314:1998;604.
2. Schmidt W.G., Esser N., Frisch A.M., Vogt P., Bernholc J., Bechstedt F., Zorn M., Hannappel T., Visbeck S., Willig F., Richter W. Phys. Rev. B. 61:2000;R16335.
3. Schmidt W.G., Bechstedt F. Surf. Sci. 409:1998;474.
4. Li L., Han B.-K., Fu Q., Hicks R.F. Phys. Rev. Lett. 82:1999;1879.
5. Vogt P., Hannappel T., Visbeck S., Knorr K., Esser N., Richter W. Phys. Rev. B. 60:1999;R5117.
6. T. Hannappel, F. Willig, German Patent, DE 19837851, Germany, 1999.
7. Hannappel T., Visbeck S., Knorr K., Mahrt J., Zorn M., Willig F. Appl. Phys. A. 69:1999;427.
8. Mac Pherson C.D., Wolkow R.A., Mitchell C.E.J., McLean A.B. Phys. Rev. Lett. 77:1996;691.
9. Weiß W., Schmeißer D., Göpel W. J. Vac. Sci. Technol. B. 8:1990;715.
10. Zettler J.T. Prog. Cryst. Growth. 35:1997;27.
11. T. Hannappel, S. Visbeck, M. Zorn, J.-T. Zettler, F. Willig, J. Cryst. Growth 221 (2000) 124.
12. Li L., Han B.-K., Law D., Li Q., Fu Q., Hicks R.F. Appl. Phys. Lett. 75:1999;683.
13. Frisch A.M., Vogt P., Hannappel T., Visbeck S., Willig F., Braun W., Schmidt W.G., Bernholc J., Richter W., Esser N. Appl. Surf. Sci. 166:2000;224.
14. Lautenschlager P., Garriga M., Cardona M. Phys. Rev. B. 36:1987;4813.
15. Schmidt W.G., Briggs E.L., Bernholc J., Bechstedt F. Phys. Rev. B. 59:1999;2234.
16. Li L., Fu Q., Li D.H., Han B.-K., Hicks R.F. Phys. Rev. B. 61:2000;10223.