Two-dimensional confined photonic wire resonators - strong light-matter coupling

Physica Status Solidi (B) Basic Research

Volumn 247, Issue 6, 2010, Pages 1351-1364

  Schmidt Grund, Rüdiger ^a   Hilmer, Helena ^a   Hinkel, Annekatrin ^a   Sturm, Chris ^a   Rheinländer, Bernd ^a   Gottschalch, Volker ^a   Lange, Martin ^a   Zúiga Pérezy, Jesus ^a,b   Grundmann, Marius ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b CRHEA CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77954147218     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200945530     Document Type: Article

References (69)

1. K. J. Vahala, Nature 424, 839 (2003).
2. J. P. Reithmaier, Semicond. Sci. Technol. 23, 123001 (2008).
3. C. Weisbuch, H. Benisty, and R. Houdre, J. Lumin. 85, 271 (2000).
4. A. Kuther, M. Bayer, T. Gutbrod, A. Forchel, P. A. Knipp, T. L. Reinecke, and R. Werner, Phys. Rev. B 58, 15744 (1998).
5. J. Kasprzak, M. Richard, R. André, and D. Le Si Dang, J. Eur. Opt. Soc. Rap. Public. 3, 08023 (2008).
6. D. D. Solnyshkov, E. Petrolati, A. Di Carlo, and G. Malpuech, Appl. Phys. Lett. 94, 011110 (2009).
7. R. Johne, D. D. Solnyshkov, and G. Malpuech, Appl. Phys. Lett. 93, 211105 (2008).
8. C. Weisbuch, M. Nishioka, A. Ishikawa, and Y. Arakawa, Phys. Rev. Lett. 69, 3314 (1992).
9. J. J. Baumberg and L. Viña (eds.), Special Issue on Microcavities, Semicond. Sci. Technol. 18 (11), (2003).
10. B. Deveaud (ed.), Special Issue on Physics of Semicon-ductor Microcavities, Phys. Status Solidi B 242 (11), (2005).
11. A. Kavokin, and G. Malpuech, Cavity Polaritons (Elsevier, New York, 2003).
12. A. Kavokin, J. J. Baumberg, G. Malpuech, and F. P. Laussy, Microcavities (Oxford University Press, Oxford, 2008).
13. J. A. Timpson, D. Sanvitto, A. Daraei, P. S. S. Guimares, H. Vinck, S. Lam, D. M. Whittaker, M. S. Skolnick, A. M. Fox, C. Y. Hu, Y.-L. D. Ho, R. Gibson, J. G. Rarity, S. Pellegrini, K. J. Gordon, R. E. Warburton, G. S. Buller, A. Tahraoui, P. W. Fry, and M. Hopkinsin, J. Mod. Opt. 54, 453 (2007).
14. S. Reitzenstein, C. Hofmann, A. Gorbunov, M. Strauß, S. H. Kwon, C. Schneider, A. Löffler, S. Höfling, M. Kamp, and A. Forchel, Appl. Phys. Lett. 90, 251109 (2007).
15. C. Böckler, S. Reitzenstein, C. Kistner, R. Debusmann, A. Löffler, T. Kida, S. Höfling, A. Forchel, L. Grenouillet, J. Claudon, and J. M. Gérard, Appl. Phys. Lett. 92, 091107 (2008).
16. H. Lohmeyer, C. Kruse, K. Sebald, J. Gutowski, and D. Hommel, Appl. Phys. Lett. 89, 091107 (2006).
17. K. Sebald, H. Lohmeyer, J. Kalden, T. Meeser, J. Gutowski, C. Kruse, A. Gust, D. Hommel, J. Wiersig, N. Baer, F. Jahnke, and J. Korean, Phys. Soc. 53,83 (2008).
18. D. Sanvitto, A. Daraei, A. Tahraoui, M. Hopkinson, P. W. Fry, D. M. Whittaker, and M. S. Skolnick, Appl. Phys. Lett. 86, 191109 (2005).
19. M. Kahl, T. Thomay, V. Kohnle, K. Beha, J. Merlein, M. Hagner, A. Halm, J. Ziegler, T. Nann, Y. Fedutik, U. Woggon, M. Artemyev, F. Pérez-Willard, A. Leiten-storfer, and R. Bratschitsch, Nano Lett. 7, 2897 (2007).
20. D. Bajoni, P. Senellart, E. Wertz, I. Sagnes, A. Miard, A. Lemaître, and J. Bloch, Phys. Rev. Lett. 100, 047401 (2008).
21. T. Rivera, J.-P. Debray, J. M. Gérard, B. Legrand, L. Manin- Ferlazzo, and J. L. Oudar, Appl. Phys. Lett. 74, 911 (1999).
22. J. Scheuer, and A. Yariv, J. Opt. Soc. Am. B 20, 2285 (2003).
23. W. M. J. Green, J. Scheuer, G. DeRose, and A. Yariv, Appl. Phys. Lett. 85, 3669 (2004).
24. W. M. J. Green, Ph.D. thesis, California Institute of Technology, Pasadena, California (2005).
25. M. A. Kaliteevski, R. A. Abram, and V. V. Nikolaev, J. Mod. Opt. 47, 677 (2000).
26. A. I. Tartakovskii, V. D. Kulakovskii, A. Forchel, and J. P. Reithmaier, Phys. Rev. B 57, R6807 (1998).
27. G. Dasbach, C. Diederichs, J. Tignon, C. Ciuti, Ph. Roussignol, C. Delalande, M. Bayer, and A. Forchel, Phys. Rev. B 71, 161308(R) (2005).
28. C. Sturm, H. Hilmer, R. Schmidt-Grund, and M. Grundmann, New J. Phys. 11, 073044 (2009).
29. M. Zamfirescu, A. Kavokin, B. Gil, G. Malpuech, and M. Kaliteevski, Phys. Rev. B 65, 161205(R) (2002).
30. R. Johne, D. D. Solnyshkov, and G. Malpuech, Appl. Phys. Lett. 93, 211105 (2008).
31. R. Shimada, J. Xie, V. Avrutin, Ü.Özgür, and H. Morkoč, Appl. Phys. Lett. 92, 011127 (2008).
32. M. Nakayama, S. Komura, T. Kawase, and D. G. Kim, J. Phys. Soc. Jpn. 77, 093705 (2008).
33. M. Mihailovic, A.-L. Henneghien, S. Faure, P. Disseix, J. Leymarie, A. Vasson, D. A. Buell, F. Semond, C. Morhain, and J. Zúñiga-Pérez, Opt. Mater. 31, 532 (2009).
34. F. Médard, J. Zúñiga-Pérez, E. Frayssinet, J. C. Moreno, F. Semond, S. Faure, P. Disseix, J. Leymarie, M. Mihailovic, A. Vasson, T. Guillet, and M. Leroux, Photonics Nanostruct. 7, 26 (2009).
35. F. Médard, J. Zúñiga-Pérez, P. Disseix, M. Mihailovic, J. Leymarie, A. Vasson, F. Semond, E. Frayssinet, J. C. Moreno, M. Leroux, S. Faure, and T. Guillet, Phys. Rev. B 79, 125302 (2009).
36. R. Schmidt-Grund, B. Rheinländer, C. Czekalla, G. Benndorf, H. Hochmuth, M. Lorenz, and M. Grundmann, Appl. Phys. B 93, 331 (2008).
37. R. Schmidt-Grund, C. Sturm, H. Hilmer, J. Sellmann, C. Czekalla, B. Rheinländer, J. Lenzner, H. Hochmuth, M. Lorenz, and M. Grundmann, AIP Conf. Proc. 1199, 175 (2010).
38. C. Sturm, H. Hilmer, R. Schmidt-Grund, C. Czekalla, J. Sellmann, J. Lenzner, M. Lorenz, and M. Grundmann, J. Vac. Sci. Technol. B 27, 1726 (2009).
39. L. Sun, Z. Chen, Q. Ren, K. Yu, L. Bai, W. Zhou, H. Xiong, Z. Q. Zhu, and X. Shen, Phys. Rev. Lett. 100, 156403 (2008).
40. Z. L. Wang, Mater. Today 7, 26 (2004).
41. G.-C. Yi, C. Wang, and W. I. Park, Semicond. Sci. Technol. 20, S22 (2005).
42. M. Grundmann, A. Rahm, T. Nobis, M. Lorenz, C. Czekalla, E. M. Kaidashev, J. Lenzner, N. Boukos, and A. Travlos, in: Handbook of Self-Assembled Semiconductor Nanostructures for Novel Devices in Photonics and Electronics, edited by M. Henini (Elsevier, Amsterdam, 2008), p. 293.
43. M. Willander, O. Nur, Q. X. Zhao, L. L. Yang, M. Lorenz, B. Q. Cao, J. Zúñiga-Pérez, C. Czekalla, G. Zimmermann, M. Grundmann, A. Bakin, A. Behrends, M. Al-Suleiman, A. El-Shaer, A. Che Mofor, B. Postels, A. Waag, N. Boukos, A. Travlos, H. S. Kwack, J. Guinard, and D. Le Si Dang, Nanotechnology 20, 332001 (2009).
44. W. Lu and C. M. Lieber, J. Phys. D, Appl. Phys. 39, R387 (2006).
45. C. Thelander, P. Agarwal, S. Brongersma, J. Eymery, L. F. Feiner, A. Forchel, M. Scheffler, W. Riess, B. J. Ohlsson, U. Gösele, and L. Samuelson, Mater. Today 9, 28 (2006).
46. H. Shtrikman, R. Popovitz-Biro, A. Kretinin, L. Houben, M. Heiblum, M. Bukaa, M. Galicka, R. Buczko, and P. Kacman, Nano Lett. 9, 1506 (2009).
47. R. Schmidt-Grund, T. Nobis, V. Gottschalch, B. Rheinländer, H. Herrnberger, and M. Grundmann, Thin Solid Films 483, 257 (2005).
48. R. Schmidt-Grund, T. Gühne, H. Hochmuth, B. Rheinländer, A. Rahm, V. Gottschalch, J. Lenzner, and M. Grundmann, Proc. SPIE 6038, 603827 (2005).
49. V. Gottschalch, R. Schmidt, B. Rheinländer, D. Pudis, S. Hardt, J. Kvietkova, G. Wagner, and R. Franzheld, Thin Solid Films 416, 224 (2002).
50. H. Hilmer, J. Sellmann, C. Sturm, R. Schmidt-Grund, B. Rheinländer, H. Hochmuth, J. Lenzner, M. Lorenz, and M. Grundmann, AIP Conf. Proc. 1199, 151 (2010).
51. H. Hilmer, C. Sturm, R. Schmidt-Grund, B. Rheinländer, and M. Grundmann, Superlattices Microstruct. 47, 19 (2010).
52. J. Sellmann, C. Sturm, R. Schmidt-Grund, C. Czekalla, J. Lenzner, H. Hochmuth, B. Rheinländer, M. Lorenz, and M. Grundmann, Phys. Status Solidi C 5, 1240 (2008).
53. Ch. Meinecke, J. Vogt, R. Schmidt-Grund, and T. Butz, Nucl. Instrum. Methods B 249, 387 (2006).
54. R. Schmidt-Grund, B. Rheinländer, T. Gühne, H. Hochmuth, V. Gottschalch, A. Rahm, J. Lenzner, and M. Grundmann, AIP Conf. Proc. 893, 1137 (2007).
55. R. Schmidt-Grund, B. Rheinländer, C. Czekalla, G. Benndorf, H. Hochmut, A. Rahm, M. Lorenz, and M. Grundmann, Superlattices Microstruct. 41, 360 (2007).
56. R. Schmidt-Grund, A. Hinkel, H. Hilmer, J. Zúñiga-Pérez, Ch. Sturm, B. Rheinländer, and M. Grundmann, in: Semiconductor Nanowires - Growth, Size-Dependent Properties, and Applications, edited by A. Javey (MRS Symposium Proceedings, Vol. 1178E, Warrendale, PA, 2009), 1178-AA10-13.
57. J. Bauer, H. Paetzelt, V. Gottschalch, and G. Wagner, Phys. Status Solidi B 247, 1294 (2010), this issue.
58. H. Paetzelt, V. Gottschalch, J. Bauer, G. Benndorf, and G. Wagner, J. Cryst. Growth 310, 5093 (2008).
59. M. Lorenz, A. Rahm, B. Cao, J. Zúñiga-Pérez, E. M. Kaidashev, N. Zhakarov, G. Wagner, T. Nobis, C. Czekalla, G. Zimmermann, and M. Grundmann, Phys. Status Solidi B 247, 1265 (2010), this issue.
60. B. Cao, J. Zúñiga-Pérez, N. Boukos, C. Czekalla, H. Hilmer, J. Lenzner, A. Travlos, M. Lorenz, and M. Grundmann, Nanotechnology 20, 305701 (2009).
61. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light, North-Holland, Amsterdam, 1984.
62. R. Joerger, K. Forcht, A. Gombert, M. Köhl, and W. Graf, Appl. Opt. 36, 319 (1997).
63. A. Röseler, Infrared Spectroscopic Ellipsometry, Akademie-Verlag, Berlin, 1990.
64. C. Czekalla, J. Lenzner, A. Rahm, T. Nobis, and M. Grundmann, Superlattices Microstruct. 41, 347 (2007).
65. C. Czekalla, T. Nobis, A. Rahm, B. Cao, J. Zúñiga-Pérez, C. Sturm, R. Schmidt-Grund, M. Lorenz, and M. Grundmann, Phys. Status Solidi B 247, 1282 (2010), this issue.
66. R. Schmidt, B. Rheinländer, M. Schubert, D. Spemann, T. Butz, J. Lenzner, E. M. Kaidashev, M. Lorenz, A. Rahm, H. C. Semmelhack, and M. Grundmann, Appl. Phys. Lett. 82, 2260 (2003).
67. R. Schmidt-Grund, N. Ashkenov, M. M. Schubert, W. Czakai, D. Faltermeier, G. Benndorf, H. Hochmuth, M. Lorenz, and M. Grundmann, AIP Conf. Proc. 893, 271 (2007).
68. C. Bundesmann, R. Schmidt-Grund, and M. Schubert, in: Transparent Conductive Zinc Oxide, edited by K. Elmer, A. Klein, and B. Rech, Springer Series in Materials Science, Vol. 104 (Springer, Berlin, Heidelberg, New York, 2008), chap. 3.
69. M. Lorenz, H. Hochmuth, D. Matusch, M. Kusunoki, V. L. Svetchnikov, V. Riede, I. Stanca, G. Kastner, and D. Hesse, IEEE Trans. Appl. Supercond. 11, 3209 (2001).