Structural and optical properties of ZrO2 and Al 2O3 thin films and Bragg reflectors grown by pulsed laser deposition

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 5, 2008, Pages 1240-1243

  Sellmann, J ^a   Sturm, Ch ^a   Schmidt Grund, R ^a   Czekalla, Ch ^a   Lenzner, J ^a   Hochmuth, H ^a   Rheinlander B ^a   Lorenz, M ^a   Grundmann, M ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

C-PLANE SAPPHIRE; FUTURE APPLICATIONS; NEAR BAND EDGE EMISSIONS; NORMAL INCIDENCE; PHOTOLUMINESCENCE INTENSITIES; SILICON SUBSTRATES; SMOOTH SURFACE; STRUCTURAL AND OPTICAL PROPERTIES; TRANSMISSION SCANNING; ZNO; ZNO THIN FILM;

ALUMINUM; BRAGG REFLECTORS; DEPOSITION; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; PULSED LASERS; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ALUMINUM COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE ROUGHNESS; THIN FILMS; ZINC OXIDE; ZIRCONIUM ALLOYS;

REFLECTION;

EID: 55349106279     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200777875     Document Type: Conference Paper

References (10)

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