ZnO micro-pillar resonators with coaxial Bragg reflectors

AIP Conference Proceedings

Volumn 893, Issue , 2007, Pages 1137-1138

  Schmidt Grund, R ^a   Rheinlander B ^a   Guhne T ^a   Hochmuth, H ^a   Gottschalch, V ^a   Rahm, A ^a   Lenzner, J ^a   Grundmann, M ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

Cylindrical; Ellipsometry; Magnesium oxide; Microcavity; Micropillar; Resonator; Silicon oxide; Zinc oxide; Zirconium oxide

Indexed keywords

EID: 77954165288     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2730298     Document Type: Conference Paper

References (24)

1. M. Zamfirescu et al., Phys. Rev. B 65, 161205(R) (2002).
2. F. H. Nicoll, Appl. Phys. Lett. 9, 13 (1966).
3. M. H. Huang et al., Science 292, 1897 (2001).
4. W. Hirschwald et al., in Current Topics in Materials Science 7, edited by E. Kaldis, North-Holland, Amsterdam, 1981, p. 143.
5. E. M. G. Heiland et al., Solid State Physics 8, 191 (1959).
6. R. Dingle, Phys. Rev. Lett. 23, 579 (1969).
7. Y. G. Wang et al., J. Crystal Growth 252, 265 (2003).
8. J. Nause, Compound Semiconductor 11, 29 (2005).
9. G. Björk et al., Phys. Rev. A 47, 4451 (1993).
10. T. Gutbrod et al., Phys. Rev. B 57, 9950 (1998).
11. J. M. Gérard and B. Gayral, Physica E 9, 131 (2001).
12. Y. Yamamoto et al., Phys. Rev. A 44, 657 (1990).
13. M. Bayer, Physica E 17, 393 (2003).
14. M. A. Kaliteevski et al., J. Mod. Optics 47, 677 (2000).
15. W. M. J. Green, PhD thesis, California Institute of Technology, Pasadena, California, 2005.
16. J. Scheuer et al., IEEE J. Sel. Top. Quantum Electron. 11, 476 (2005).
17. T. Erdogan et al., Appl. Phys. Lett. 60, 1921 (1992).
18. A. Shaw et al., Appl. Phys. Lett. 75, 3051 (1999).
19. V. Gottschalch et al., Thin Solid Films 416, 224 (2002).
20. M. Lorenz et al., Ann. Phys. 13, 59 (2004).
21. R. Schmidt-Grund et al., Thin Solid Films 483, 257 (2005).
22. R. Schmidt-Grund et al., SPIE 6038, 489 (2005).
23. R. Schmidt-Grund et al., J. Appl. Phys. 99, 123701 (2006).
24. M. Lorenz et al., Appl. Phys. Lett. 86, 143113 (2005).