Strain analysis by inversion of coherent Bragg X-ray diffraction intensity: The illumination problem

Journal of Modern Optics

Volumn 57, Issue 9, 2010, Pages 816-825

  Chamard, V ^a   Dolle M ^b   Baldinozzi, G ^c   Livet, F ^d   De Boissieu, M ^d   Labat, S ^a   Picca, F ^e   Mocuta, C ^e   Donnadieu, P ^d   Metzger, T H ^f  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b CEMES CNRS   (France)

^c ECOLE CENTRALE PARIS   (France)

^d UNIV GRENOBLE ALPES   (France)

^e SYNCHROTRON SOLEIL   (France)

^f EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

coherent X ray diffraction; inversion problem; nano crystals; nano focusing; strain analysis

Indexed keywords

WAVEFRONTS;

COHERENT X-RAY DIFFRACTION; COHERENT X-RAY DIFFRACTION IMAGING; DIFFRACTION INTENSITY; INVERSION PROBLEMS; NANO-FOCUSING; PROJECTED DENSITY; STRAIN ANALYSIS; STRAIN INFORMATION;

X RAY DIFFRACTION;

EID: 77954055562     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500341003746645     Document Type: Article

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