-
2
-
-
0024751374
-
Bias dependence of the MODFET intrinsic model elements values at microwave frequencies
-
Oct.
-
B. Hughes and P. J. Tasker, "Bias dependence of the MODFET intrinsic model elements values at microwave frequencies," IEEE Trans. Electron Devices, vol.36, no.10, pp. 2267-2273, Oct. 1989.
-
(1989)
IEEE Trans. Electron Devices
, vol.36
, Issue.10
, pp. 2267-2273
-
-
Hughes, B.1
Tasker, P.J.2
-
3
-
-
0024048518
-
A new method for determining the FET small-signal equivalent circuit
-
Jul.
-
G. Dambrine, A. Cappy, F. Heliodore, and E. Playez, "A new method for determining the FET small-signal equivalent circuit," IEEE Trans. Microw. Theory Tech., vol.36, no.7, pp. 1151-1159, Jul. 1988.
-
(1988)
IEEE Trans. Microw. Theory Tech.
, vol.36
, Issue.7
, pp. 1151-1159
-
-
Dambrine, G.1
Cappy, A.2
Heliodore, F.3
Playez, E.4
-
4
-
-
33746453817
-
A low gate bias model extraction technique for AlGaN/GaN HEMTs
-
Jul.
-
G. Chen, V. Kumar, R. S. Schwindt, and I. Adesida, "A low gate bias model extraction technique for AlGaN/GaN HEMTs," IEEE Trans. Microw. Theory Tech., vol.54, no.7, pp. 2949-2953, Jul. 2006.
-
(2006)
IEEE Trans. Microw. Theory Tech.
, vol.54
, Issue.7
, pp. 2949-2953
-
-
Chen, G.1
Kumar, V.2
Schwindt, R.S.3
Adesida, I.4
-
5
-
-
36248968146
-
A new small-signal modeling and extraction method in AlGaN/GaN HEMTs
-
Jan.
-
J. Lu, Y. Wang, L. Ma, and Z. Yu, "A new small-signal modeling and extraction method in AlGaN/GaN HEMTs," Solid-State Electron., vol.52, no.1, pp. 115-120, Jan. 2008.
-
(2008)
Solid-State Electron.
, vol.52
, Issue.1
, pp. 115-120
-
-
Lu, J.1
Wang, Y.2
Ma, L.3
Yu, Z.4
-
6
-
-
28144456249
-
A new small-signal modeling approach applied to GaN devices
-
Nov.
-
A. Jarndal and G. Kompa, "A new small-signal modeling approach applied to GaN devices," IEEE Trans. Microw. Theory Tech., vol.53, no.11, pp. 3440-3448, Nov. 2005.
-
(2005)
IEEE Trans. Microw. Theory Tech.
, vol.53
, Issue.11
, pp. 3440-3448
-
-
Jarndal, A.1
Kompa, G.2
-
7
-
-
5444249923
-
Surface-related drain current dispersion effects in AlGaNGaN HEMTs
-
Oct.
-
G. Meneghesso, G. Verzellesi, R. Pierobon, F. Rampazzo, A. Chini, U. K. Mishra, C. Canali, and E. Zanoni, "Surface-related drain current dispersion effects in AlGaNGaN HEMTs," IEEE Trans. Electron Devices, vol.51, no.10, pp. 1554-1561, Oct. 2004.
-
(2004)
IEEE Trans. Electron Devices
, vol.51
, Issue.10
, pp. 1554-1561
-
-
Meneghesso, G.1
Verzellesi, G.2
Pierobon, R.3
Rampazzo, F.4
Chini, A.5
Mishra, U.K.6
Canali, C.7
Zanoni, E.8
-
8
-
-
23144448855
-
Broad-band characterization of FET self-heating
-
Jul.
-
A. E. Parker and J. G. Rathmell, "Broad-band characterization of FET self-heating," IEEE Trans. Microw. Theory Tech., vol.53, no.7, pp. 2424-2429, Jul. 2005.
-
(2005)
IEEE Trans. Microw. Theory Tech.
, vol.53
, Issue.7
, pp. 2424-2429
-
-
Parker, A.E.1
Rathmell, J.G.2
-
9
-
-
33947251311
-
At-bias extraction of access parasitic resistances in AlGaN/GaN HEMTs: Impact on device linearity and channel electron velocity
-
Dec.
-
D. W. DiSanto and C. R. Bolognesi, "At-bias extraction of access parasitic resistances in AlGaN/GaN HEMTs: Impact on device linearity and channel electron velocity," IEEE Trans. Electron Devices, vol.53, no.12, pp. 2914-2919, Dec. 2006.
-
(2006)
IEEE Trans. Electron Devices
, vol.53
, Issue.12
, pp. 2914-2919
-
-
Disanto, D.W.1
Bolognesi, C.R.2
-
10
-
-
0031139354
-
An improved small signal equivalent circuit model for III-V nitride MODFET's with large contact resistances
-
May
-
J. Burm, W. Schaff, L. Eastman, H. Amano, and I. Akasaki, "An improved small signal equivalent circuit model for III-V nitride MODFET's with large contact resistances," IEEE Trans. Electron Devices, vol.44, no.5, pp. 906-907, May 1997.
-
(1997)
IEEE Trans. Electron Devices
, vol.44
, Issue.5
, pp. 906-907
-
-
Burm, J.1
Schaff, W.2
Eastman, L.3
Amano, H.4
Akasaki, I.5
-
11
-
-
0037291094
-
Direct determination of the bias-dependent series parasitic elements in SiC MESFETs
-
Feb.
-
S. Manohar, A. Pham, and N. Evers, "Direct determination of the bias-dependent series parasitic elements in SiC MESFETs," IEEE Trans. Microw. Theory Tech., vol.51, no.2, pp. 597-600, Feb. 2003.
-
(2003)
IEEE Trans. Microw. Theory Tech.
, vol.51
, Issue.2
, pp. 597-600
-
-
Manohar, S.1
Pham, A.2
Evers, N.3
-
12
-
-
0029275982
-
An approach to determining an equivalent circuit for HEMTs
-
Mar.
-
K. Shirakawa, H. Oikawa, T. Shimura, T. Kawasaki, Y. Ohashi, T. Saito, and Y. Daido, "An approach to determining an equivalent circuit for HEMTs," IEEE Trans. Microw. Theory Tech., vol.43, no.3, pp. 499-503, Mar. 1995.
-
(1995)
IEEE Trans. Microw. Theory Tech.
, vol.43
, Issue.3
, pp. 499-503
-
-
Shirakawa, K.1
Oikawa, H.2
Shimura, T.3
Kawasaki, T.4
Ohashi, Y.5
Saito, T.6
Daido, Y.7
-
13
-
-
0020098535
-
Microwave wide-band model of GaAs dual gate MESFETs
-
Mar.
-
C. Tsironis and R. Meierer, "Microwave wide-band model of GaAs dual gate MESFETs," IEEE Trans. Microw. Theory Tech., vol.30, no.3, pp. 243-251, Mar. 1982.
-
(1982)
IEEE Trans. Microw. Theory Tech.
, vol.30
, Issue.3
, pp. 243-251
-
-
Tsironis, C.1
Meierer, R.2
-
14
-
-
47649108736
-
An improved small-signal parameter-extraction algorithm for GaN HEMT devices
-
Jul.
-
R. G. Brady, C. H. Oxley, and T. J. Brazil, "An improved small-signal parameter-extraction algorithm for GaN HEMT devices," IEEE Trans. Microw. Theory Tech., vol.56, no.7, pp. 1535-1544, Jul. 2008.
-
(2008)
IEEE Trans. Microw. Theory Tech.
, vol.56
, Issue.7
, pp. 1535-1544
-
-
Brady, R.G.1
Oxley, C.H.2
Brazil, T.J.3
-
15
-
-
0026103702
-
High-frequency equivalent circuit of GaAs FETs for large-signal applications
-
Feb.
-
M. Berroth and R. Bosch, "High-frequency equivalent circuit of GaAs FETs for large-signal applications," IEEE Trans. Microw. Theory Tech., vol.39, no.2, pp. 224-229, Feb. 1991.
-
(1991)
IEEE Trans. Microw. Theory Tech.
, vol.39
, Issue.2
, pp. 224-229
-
-
Berroth, M.1
Bosch, R.2
-
17
-
-
0025465290
-
Broad-band determination of the FET small-signal equivalent circuit
-
Jul.
-
M. Berroth and R. Bosch, "Broad-band determination of the FET small-signal equivalent circuit," IEEE Trans. Microw. Theory Tech., vol.38, no.7, pp. 891-895, Jul. 1990.
-
(1990)
IEEE Trans. Microw. Theory Tech.
, vol.38
, Issue.7
, pp. 891-895
-
-
Berroth, M.1
Bosch, R.2
-
18
-
-
0035394387
-
An analytic method to determine GaAs FET parasitic inductances and drain resistance under active bias conditions
-
Jul.
-
C. F. Campbell and S. A. Brown, "An analytic method to determine GaAs FET parasitic inductances and drain resistance under active bias conditions," IEEE Trans. Microw. Theory Tech., vol.49, no.7, pp. 1241-1247, Jul. 2001.
-
(2001)
IEEE Trans. Microw. Theory Tech.
, vol.49
, Issue.7
, pp. 1241-1247
-
-
Campbell, C.F.1
Brown, S.A.2
-
21
-
-
0037234573
-
Novel technique for estimating metal semiconductor field effect transistor parasitics
-
Dec.
-
Y. A. Khalaf and S. M. Riad, "Novel technique for estimating metal semiconductor field effect transistor parasitics," Int. J. RF Microw. Comput. Aided Eng., vol.13, no.1, pp. 62-73, Dec. 2002.
-
(2002)
Int. J. RF Microw. Comput. Aided Eng.
, vol.13
, Issue.1
, pp. 62-73
-
-
Khalaf, Y.A.1
Riad, S.M.2
-
22
-
-
0032665814
-
Low flicker-noise GaN/AlGaN heterostructure field effect transistors for microwave communications
-
Aug.
-
A. Balandin, S. V. Morozov, S. Cai, R. Li, K. L. Wang, G. Wijeratne, and C. R. Viswanathan, "Low flicker-noise GaN/AlGaN heterostructure field effect transistors for microwave communications," IEEE Trans. Microw. Theory Tech., vol.47, no.8, pp. 1413-1417, Aug. 1999.
-
(1999)
IEEE Trans. Microw. Theory Tech.
, vol.47
, Issue.8
, pp. 1413-1417
-
-
Balandin, A.1
Morozov, S.V.2
Cai, S.3
Li, R.4
Wang, K.L.5
Wijeratne, G.6
Viswanathan, C.R.7
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