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Volumn 47, Issue 8, 1999, Pages 1413-1417

Low flicker-noise GaN/AlGaN heterostructure field-effect transistors for microwave communications

Author keywords

[No Author keywords available]

Indexed keywords

HETEROJUNCTIONS; NITROGEN COMPOUNDS; OPTIMIZATION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; SIGNAL NOISE MEASUREMENT;

EID: 0032665814     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.780388     Document Type: Article
Times cited : (94)

References (13)
  • 2
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    • D. V. Kuksenkov, H. Temkin, R. Gaska, and J. W. Yang, "Lowfrequency noise in AlGaN/GaN heterostructure field effect transistors," IEEE Electron Device Lett., vol. 19, pp. 222-224, July 1998.
    • IEEE Electron Device Lett.
    • Kuksenkov, D.V.1    Temkin, H.2    Gaska, R.3    Yang, J.W.4
  • 3
    • 0032299759 scopus 로고    scopus 로고
    • "Flicker noise in GaN/Alo.isGao.gsN-doped channel heterostructure field effect transistors," vol. 19, pp. 47577, Dec. 1998.
    • A. Balandin, S. Cai, R. Li, K. L. Wang, V. R. Rao, and C. R. Viswanathan, "Flicker noise in GaN/Alo.isGao.gsN-doped channel heterostructure field effect transistors," IEEE Electron Device Lett., vol. 19, pp. 47577, Dec. 1998.
    • IEEE Electron Device Lett.
    • Balandin, A.1    Cai, S.2    Li, R.3    Wang, K.L.4    Rao, V.R.5    Viswanathan, C.R.6
  • 4
    • 0000232109 scopus 로고    scopus 로고
    • "AlGaN/GaN high electron mobility field effect transistors with low I// noise," vol. 73, no. 8, p. 1089, 1998.
    • M. E. Levinshtein, S. L. Rumyantsev, R. Gaska, J. W. Yang, and M. S. Shur, "AlGaN/GaN high electron mobility field effect transistors with low I// noise," Appl. Phys. Lett., vol. 73, no. 8, p. 1089, 1998.
    • Appl. Phys. Lett.
    • Levinshtein, M.E.1    Rumyantsev, S.L.2    Gaska, R.3    Yang, J.W.4    Shur, M.S.5
  • 5
    • 0023980926 scopus 로고    scopus 로고
    • "Unified presentation of I// noise in electronic devices: Fundamental I// noise sources," vol. 76, p. 233, Mar. 1988.
    • For a review on I// noise device theory see A. Van Der Ziel, "Unified presentation of I// noise in electronic devices: Fundamental I// noise sources," Proc. IEEE, vol. 76, p. 233, Mar. 1988.
    • Proc. IEEE
    • Van Der Ziel, A.1
  • 7
    • 0028548483 scopus 로고    scopus 로고
    • "Flicker noise in CMOS transistors from subthreshold to strong inversion at various temperatures," vol. 41, pp. 1965-1971, Nov. 1994.
    • J. Chang, A. A. Abidi, and C. R. Viswanathan, "Flicker noise in CMOS transistors from subthreshold to strong inversion at various temperatures," IEEE Trans. Electron. Devices, vol. 41, pp. 1965-1971, Nov. 1994.
    • IEEE Trans. Electron. Devices
    • Chang, J.1    Abidi, A.A.2    Viswanathan, C.R.3
  • 11
    • 0019007903 scopus 로고    scopus 로고
    • "Model for I// noise in MOS transistors biased in the linear region," vol. 23, p. 317, 1980.
    • L. K. J. Vandamme, "Model for I// noise in MOS transistors biased in the linear region," Solid State Electron., vol. 23, p. 317, 1980.
    • Solid State Electron.
    • Vandamme, L.K.J.1
  • 12
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    • "I// Noise model for MOST's biased in nonohmic region," vol. 23, p. 325, 1980.
    • L. K. J. Vandamme and H. M. M. de Werd, "I// Noise model for MOST's biased in nonohmic region," Solid State Electron., vol. 23, p. 325, 1980.
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    • Vandamme, L.K.J.1    De Werd, H.M.M.2
  • 13
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    • "Spectral dependence of 1/7 noise on gate bias in JV-MOSFETS," vol. 30, p. 419, 1987.
    • Z. Celik-Butler and T. Y. Hsiang, "Spectral dependence of 1/7 noise on gate bias in JV-MOSFETS," Solid State Electron., vol. 30, p. 419, 1987.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.