Novel technique for estimating metal semiconductor field effect transistor parasitics

International Journal of RF and Microwave Computer-Aided Engineering

Volumn 13, Issue 1, 2003, Pages 62-73

  Khalaf, Yaser A ^a   Riad, Sedki M ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

Characterization; Extrinsic parasitics; MES field effect transistor; Modeling; Optimization

Indexed keywords

CAPACITANCE; ELECTRIC RESISTANCE; INDUCTANCE; OPTIMIZATION; SCATTERING PARAMETERS; SEMICONDUCTOR DEVICE MODELS;

EXTRINSIC PARASITICS; PARASITIC INDUCTANCES;

MESFET DEVICES;

EID: 0037234573     PISSN: 10964290     EISSN: None     Source Type: Journal    
DOI: 10.1002/mmce.10063     Document Type: Article

References (8)

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