A new way of measuring microscope aberrations

Ultramicroscopy

Volumn 81, Issue 2, 2000, Pages 41-45

  Saxton, W O ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Aberrations; Auto adjustment; Diffractograms; High resolution

Indexed keywords

ABERRATIONS; ELECTROMAGNETIC WAVE DIFFRACTION; FOCUSING; MICROSCOPES; OPTICAL RESOLVING POWER;

ASTIGMATISM;

OPTICAL MICROSCOPY;

ACCURACY; ADJUSTMENT; ANISOTROPY; ARTICLE; ASTIGMATISM; DATA ANALYSIS; DIAGNOSTIC ERROR; IMAGE ANALYSIS; MICROSCOPY; STANDARD;

EID: 0034160090     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00163-1     Document Type: Article

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9. W.O. Saxton, A.I. Kirkland, R. Dunin-Borkowski, J.L. Hutchison, R.R. Meyer, J. Microsc., submitted for publication.