Compact and vertically-aligned ZnO nanorod thin films by the low-temperature solution method

Thin Solid Films

Volumn 518, Issue 15, 2010, Pages 4156-4162

  Ting, Chu Chi ^a   Li, Chang Hung ^a   Kuo, Chih You ^a   Hsu, Chia Chen ^a   Wang, Hsiang Chen ^a   Yang, Ming Hsun ^a  

^a NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

Author keywords

Chemical solution deposition; Nanorods; Packing density; Photoluminescence; Scanning electron microscopy; Transmittance; Zinc oxide

Indexed keywords

ALIGNED ZNO NANORODS; AVERAGE GRAIN SIZE; CHEMICAL SOLUTION DEPOSITION; ENERGY BANDGAPS; GRAIN SIZE; GROWTH TECHNIQUES; HIGH QUALITY; INTERSTITIALS; LOW TEMPERATURES; OPTIMUM PARAMETERS; PACKING DENSITY; PHOTOLUMINESCENCE SPECTRUM; SEED LAYER; SILICA GLASS SUBSTRATE; SOLUTION METHODS; VISIBLE TRANSMITTANCE; ZNO; ZNO NANOROD;

CHEMICALS; FILM THICKNESS; GRAIN SIZE AND SHAPE; NANORODS; OXYGEN; OXYGEN VACANCIES; PHOTOLUMINESCENCE; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SILICA; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION; ZINC;

ZINC OXIDE;

EID: 77953306971     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.11.082     Document Type: Article

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