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Volumn 7641, Issue , 2010, Pages

A GPU-based full-chip inverse lithography solution for random patterns

Author keywords

Computational lithography; Feedback control; Full chip; Graphics processors; Inverse lithography; Optimization

Indexed keywords

COMPUTATIONAL LITHOGRAPHY; COMPUTATIONAL REQUIREMENTS; GRAPHIC PROCESSORS; GRAPHICS PROCESSOR; GRAPHICS PROCESSORS; INVERSE LITHOGRAPHY; MANUFACTURABILITY; MANUFACTURING PROCESS; MODELING AND SIMULATION; OPTIMIZATION APPROACH; PROCESS WINDOW; RANDOM PATTERN;

EID: 77953280459     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.846638     Document Type: Conference Paper
Times cited : (14)

References (28)
  • 2
    • 77953278723 scopus 로고    scopus 로고
    • The School of Computer and Communication Sciences, Research Day, May Also available at
    • Raul Camposano,"Scaling Manufacturability Software to Thousands of Processors," The School of Computer and Communication Sciences, École Polytechnique Fédérale de Lausanne, Research Day, May (2006). Also available at: http://ic.epfl.ch/webdav/site/ic/shared/ResearchDay/ C-slides.pdf
    • (2006) Scaling Manufacturability Software to Thousands of Processors
    • Camposano, R.1
  • 4
    • 0021892214 scopus 로고
    • Image design: Generation of a prescribed image through a diffraction limited system with high-contrast recording
    • S. Sayegh, B. Saleh, and K. Nashold, "Image design: Generation of a prescribed image through a diffraction limited system with high-contrast recording," IEEE Transaction on Acoustics, Speech and Signal Processing, pp. 460-465, (1985).
    • (1985) IEEE Transaction on Acoustics, Speech and Signal Processing , pp. 460-465
    • Sayegh, S.1    Saleh, B.2    Nashold, K.3
  • 5
    • 0030151364 scopus 로고    scopus 로고
    • Computer aided phase shift mask design with reduced complexity
    • Y. Liu and A. Zakhor, "Computer aided phase shift mask design with reduced complexity," IEEE Trans. on Semiconductor Manufacturing, pp. 170-184, (1996).
    • (1996) IEEE Trans. on Semiconductor Manufacturing , pp. 170-184
    • Liu, Y.1    Zakhor, A.2
  • 6
    • 71549126234 scopus 로고    scopus 로고
    • Optimum mask and source patterns to print a given shape
    • A. Rosenbluth et. al, Optimum mask and source patterns to print a given shape, JM3, Vol. 1, pp 13-30, (2002).
    • (2002) JM3 , vol.1 , pp. 13-30
    • Rosenbluth, A.1
  • 7
    • 25144486100 scopus 로고    scopus 로고
    • Solving inverse problems of optical microlithography
    • Y. Granik, "Solving inverse problems of optical microlithography, " in Optical Microlithography, Proc. SPIE, Vol. 5754, pp. 506-526, (2005).
    • (2005) Optical Microlithography, Proc. SPIE , vol.5754 , pp. 506-526
    • Granik, Y.1
  • 8
    • 21944435130 scopus 로고    scopus 로고
    • Prewarping techniques in imaging: Applications in nanotechnology and biotechnology
    • A. Poonawala and P. Milanfar, "Prewarping techniques in imaging: Applications in nanotechnology and biotechnology," in Electronic Imaging, Proc. SPIE, Vol. 5674, pp. 114-127, (2005).
    • (2005) Electronic Imaging, Proc. SPIE , vol.5674 , pp. 114-127
    • Poonawala, A.1    Milanfar, P.2
  • 9
    • 25144510087 scopus 로고    scopus 로고
    • Improved mask and source representations for automatic optimization of lithographic process conditions using a genetic algorithm
    • T. Fuhner and A. Erdmann, Improved mask and source representations for automatic optimization of lithographic process conditions using a genetic algorithm, Proc. SPIE Vol. 5754 pp 415-426, (2005).
    • (2005) Proc. SPIE , vol.5754 , pp. 415-426
    • Fuhner, T.1    Erdmann, A.2
  • 10
    • 33748039112 scopus 로고    scopus 로고
    • Inverse Lithography Technology (ILT), What is the Impact to Photomask Industry?
    • Pang, L., et al, "Inverse Lithography Technology (ILT), What is the Impact to Photomask Industry?", Proc. SPIE, Vol. 6283, (2006).
    • (2006) Proc. SPIE , vol.6283
    • Pang, L.1
  • 11
    • 33748049879 scopus 로고    scopus 로고
    • Inverse Lithography Technology at Chip Scale, 31st International Symposium of Microlithography
    • Lin, B., et al, "Inverse Lithography Technology at Chip Scale, 31st International Symposium of Microlithography", Proc. of SPIE, Vol. 6154, (2006).
    • (2006) Proc. of SPIE , vol.6154
    • Lin, B.1
  • 12
    • 42149178602 scopus 로고    scopus 로고
    • Inverse Lithography Technology (ILT): Keep the balance between SRAF and MRC at 45and 32 nm
    • Pang, L., et al, "Inverse Lithography Technology (ILT): Keep the balance between SRAF and MRC at 45and 32 nm", Proc. SPIE, Vol. 6730, (2007).
    • (2007) Proc. SPIE , vol.6730
    • Pang, L.1
  • 13
    • 45449102095 scopus 로고    scopus 로고
    • Validation of Inverse Lithography Technology (ILT) and Its Adaptive SRAF at Advanced Technology Nodes
    • Pang, L., et al, "Validation of Inverse Lithography Technology (ILT) and Its Adaptive SRAF at Advanced Technology Nodes ", Proc. SPIE, Vol. 6924, (2008).
    • (2008) Proc. SPIE , vol.6924
    • Pang, L.1
  • 14
    • 43249116426 scopus 로고    scopus 로고
    • Inverse Lithography as a DFM Tool: Accelerating Design Rule Development with Model-Based Assist Feature Placement, Fast Optical Proximity Correction and Lithographic Hotspot Detection
    • Prins, S. L., et al, "Inverse Lithography as a DFM Tool: Accelerating Design Rule Development with Model-Based Assist Feature Placement, Fast Optical Proximity Correction and Lithographic Hotspot Detection", Proc. SPIE, Vol. 6924, (2008).
    • (2008) Proc. SPIE , vol.6924
    • Prins, S.L.1
  • 15
    • 45449097846 scopus 로고    scopus 로고
    • Evaluation of Inverse Lithography Technology for 55nm-node memory device
    • Cho, B.U., et al, "Evaluation of Inverse Lithography Technology for 55nm-node memory device", Proc. SPIE, Vol. 6924, (2008).
    • (2008) Proc. SPIE , vol.6924
    • Cho, B.U.1
  • 16
    • 3843090460 scopus 로고    scopus 로고
    • Do we need complex resist models for predictive simulation of lithographic process performance
    • Tollkuhn, et.al., "Do we need complex resist models for predictive simulation of lithographic process performance", Proc. SPIE, Vol. 5376, (2004).
    • (2004) Proc. SPIE , vol.5376
    • Tollkuhn1
  • 17
    • 0001316293 scopus 로고    scopus 로고
    • Quasi-physical model for fast resist contour simulation: Importance of lens aberrations and acid diffusion in LSI Pattern Design
    • Fukuda H., Hattori K. "Quasi-physical model for fast resist contour simulation: importance of lens aberrations and acid diffusion in LSI Pattern Design", Proc. SPIE, Vol. 3334, pp 154-163, (1998).
    • (1998) Proc. SPIE , vol.3334 , pp. 154-163
    • Fukuda, H.1    Hattori, K.2
  • 18
    • 77953259320 scopus 로고
    • Enhanced Lumped Parameter Model for Lithography
    • Mack Chris, "Enhanced Lumped Parameter Model for Lithography", Proc of SPIE Vol. 2197, (1994).
    • (1994) Proc of SPIE , vol.2197
    • Chris, M.1
  • 19
    • 0141609913 scopus 로고    scopus 로고
    • Boundary Layer Model to Account for Thick Mask Effects in PhotoLithography
    • Taipoz, et.al., "Boundary Layer Model to Account for Thick Mask Effects in PhotoLithography", Proc. SPIE, Vol. 5040, (2003).
    • (2003) Proc. SPIE , vol.5040
    • Taipoz1
  • 21
    • 77953266129 scopus 로고    scopus 로고
    • http://www.fftw.org/speed/Pentium4-3.60GHz-icc/
  • 23
    • 77953280243 scopus 로고    scopus 로고
    • Optical Proximity Correction on Hardware or Software Platforms with Graphical Processing Units
    • US and International Patent, 7546574
    • I. Torunoglu and A. Karakas, "Optical Proximity Correction on Hardware or Software Platforms with Graphical Processing Units," US and International Patent, 7546574, (2006).
    • (2006)
    • Torunoglu, I.1    Karakas, A.2
  • 24
    • 77953255321 scopus 로고    scopus 로고
    • Performing OPC on Hardware or Software Platforms with GPU
    • US and International Patent, 12480958
    • I. Torunoglu and A. Karakas, "Performing OPC on Hardware or Software Platforms with GPU," US and International Patent, 12480958, (2006).
    • (2006)
    • Torunoglu, I.1    Karakas, A.2
  • 25
    • 77953240789 scopus 로고    scopus 로고
    • Instruction Set Architecture-Based Hardware and Software Platform for EDA
    • US and International Patent, 11566146
    • I. Torunoglu and A. Karakas, "Instruction Set Architecture-Based Hardware and Software Platform for EDA," US and International Patent, 11566146, (2006).
    • (2006)
    • Torunoglu, I.1    Karakas, A.2
  • 26
    • 77953244997 scopus 로고    scopus 로고
    • Lithography Mask Design Through Mask Functional Optimization and Spatial Frequency Analysis
    • US and International Patent, 60827295
    • P. J. Ungar and I. Torunoglu, "Lithography Mask Design Through Mask Functional Optimization and Spatial Frequency Analysis," US and International Patent, 60827295, (2007).
    • (2007)
    • Ungar, P.J.1    Torunoglu, I.2
  • 27
    • 77953283179 scopus 로고    scopus 로고
    • Solution-Dependent Regularization Method for Quantizing Continuous-Tone Lithography Masks
    • US and International Patent, 11864381
    • P. J. Ungar and I. Torunoglu, "Solution-Dependent Regularization Method for Quantizing Continuous-Tone Lithography Masks," US and International Patent, 11864381, (2007).
    • (2007)
    • Ungar, P.J.1    Torunoglu, I.2
  • 28
    • 77953248964 scopus 로고    scopus 로고
    • Method for Computing Partially Coherent Scalar or Vector Images Using Fast Eigenfunction Decomposition in Real Space
    • US and International Patent, 11864419
    • P. J. Ungar, "Method for Computing Partially Coherent Scalar or Vector Images Using Fast Eigenfunction Decomposition in Real Space," US and International Patent, 11864419, (2007).
    • (2007)
    • Ungar, P.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.